scholarly journals Dependence of carrier escape lifetimes on quantum barrier thickness in InGaN/GaN multiple quantum well photodetectors

2020 ◽  
Vol 28 (16) ◽  
pp. 23796
Author(s):  
Yi Chao Chow ◽  
Changmin Lee ◽  
Matthew S. Wong ◽  
Yuh-Renn Wu ◽  
Shuji Nakamura ◽  
...  
2018 ◽  
Vol 39 (2) ◽  
pp. 208-213
Author(s):  
黄佳琳 HUANG Jia-lin ◽  
易淋凯 YI Lin-kai ◽  
周梅 ZHOU Mei ◽  
赵德刚 ZHAO De-gang

2013 ◽  
Vol 103 (3) ◽  
pp. 033901 ◽  
Author(s):  
Sang-Bae Choi ◽  
Jae-Phil Shim ◽  
Dong-Min Kim ◽  
Hoon-Il Jeong ◽  
Young-Dahl Jho ◽  
...  

2012 ◽  
Vol 51 ◽  
pp. 10ND10 ◽  
Author(s):  
Noriyuki Watanabe ◽  
Haruki Yokoyama ◽  
Naoteru Shigekawa ◽  
Ken-ichi Sugita ◽  
Akio Yamamoto

2000 ◽  
Vol 12 (2) ◽  
pp. 134-136 ◽  
Author(s):  
M.J. Hamp ◽  
D.T. Cassidy ◽  
B.J. Robinson ◽  
Q.C. Zhao ◽  
D.A. Thompson

2015 ◽  
Vol 54 (7) ◽  
pp. 072302 ◽  
Author(s):  
Luca Redaelli ◽  
Anna Mukhtarova ◽  
Akhil Ajay ◽  
Arántzazu Núñez-Cascajero ◽  
Sirona Valdueza-Felip ◽  
...  

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