High-accuracy algorithms for computational aeroacoustics

AIAA Journal ◽  
1995 ◽  
Vol 33 (2) ◽  
pp. 246-251 ◽  
Author(s):  
David P. Lockard ◽  
Kenneth S. Brentner ◽  
H. L. Atkins
1994 ◽  
Author(s):  
David Lockard ◽  
Kenneth Brentner ◽  
H. Atkins

2009 ◽  
Vol 228 (10) ◽  
pp. 3837-3850 ◽  
Author(s):  
Vasanth Allampalli ◽  
Ray Hixon ◽  
M. Nallasamy ◽  
Scott D. Sawyer

Author(s):  
M. Nishigaki ◽  
S. Katagiri ◽  
H. Kimura ◽  
B. Tadano

The high voltage electron microscope has many advantageous features in comparison with the ordinary electron microscope. They are a higher penetrating efficiency of the electron, low chromatic aberration, high accuracy of the selected area diffraction and so on. Thus, the high voltage electron microscope becomes an indispensable instrument for the metallurgical, polymer and biological specimen studies. The application of the instrument involves today not only basic research but routine survey in the various fields. Particularly for the latter purpose, the performance, maintenance and reliability of the microscope should be same as those of commercial ones. The authors completed a 500 kV electron microscope in 1964 and a 1,000 kV one in 1966 taking these points into consideration. The construction of our 1,000 kV electron microscope is described below.


Sign in / Sign up

Export Citation Format

Share Document