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Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
Mapping Intimacies
◽
10.3403/30276380
◽
2015
◽
Keyword(s):
Chemical Analysis
◽
Fluorescence Spectroscopy
◽
Environmental Analysis
◽
Total Reflection
◽
Surface Chemical
◽
X Ray
◽
Surface Chemical Analysis
Download Full-text
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Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
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Summary of ISO/TC 201 Standard: VI ISO 14706:2000?Surface chemical analysis?Determination of surface elemental contamination on silicon wafers by total reflection x-ray fluorescence (TXRF) spectroscopy
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Summary of ISO/TC 201 Standard: XIX ISO 17331:2004—Surface chemical analysis—Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection x-ray fluorescence (TXRF) spectroscopy
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Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
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Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
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Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
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◽
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◽
Keyword(s):
Chemical Analysis
◽
Silicon Wafer
◽
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◽
Total Reflection
◽
Surface Chemical
◽
Chemical Methods
◽
X Ray
◽
Surface Chemical Analysis
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