M2M Transformation Rules for Automatic Test Case Generation from Sequence Diagram

KIISE Transactions on Computing Practices ◽

10.5626/ktcp.2016.22.1.32 ◽

2016 ◽

Vol 22 (1) ◽

pp. 32-37

Author(s):

Jin-a Kim ◽

Su Ji Kim ◽

Yongjin Seo ◽

Eunyoung Cheon ◽

Hyeon Soo Kim

Keyword(s):

Sequence Diagram ◽

Test Case Generation ◽

Test Case ◽

Automatic Test ◽

Transformation Rules ◽

Automatic Test Case Generation

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Automatic Test Case Generation from UML Sequence Diagram

15th International Conference on Advanced Computing and Communications (ADCOM 2007) ◽

10.1109/adcom.2007.68 ◽

2007 ◽

Author(s):

Monalisa Sarma ◽

Debasish Kundu ◽

Rajib Mall

Keyword(s):

Sequence Diagram ◽

Test Case Generation ◽

Test Case ◽

Automatic Test ◽

Automatic Test Case Generation ◽

Uml Sequence Diagram

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Automatic Test Case Generation Using Sequence Diagram

Advances in Intelligent Systems and Computing - Proceedings of International Conference on Advances in Computing ◽

10.1007/978-81-322-0740-5_33 ◽

2013 ◽

pp. 277-284 ◽

Author(s):

Vikas Panthi ◽

Durga Prasad Mohapatra

Keyword(s):

Sequence Diagram ◽

Test Case Generation ◽

Test Case ◽

Automatic Test ◽

Automatic Test Case Generation

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Automatic Test Case Generation from Usage Information

2018 11th International Conference on the Quality of Information and Communications Technology (QUATIC) ◽

10.1109/quatic.2018.00047 ◽

2018 ◽

Author(s):

Pedro Silva ◽

Ana C. R. Paiva ◽

Andre Restivo ◽

Jorge Esparteiro Garcia

Keyword(s):

Test Case Generation ◽

Test Case ◽

Automatic Test ◽

Automatic Test Case Generation

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Automatic Test Case Generation for Prime Field Elliptic Curve Cryptographic Circuits

2021 IEEE 17th International Colloquium on Signal Processing & Its Applications (CSPA) ◽

10.1109/cspa52141.2021.9377300 ◽

2021 ◽

Author(s):

Krishn Kumar Gupt ◽

Meghana Kshirsagar ◽

Joseph P. Sullivan ◽

Conor Ryan

Keyword(s):

Elliptic Curve ◽

Test Case Generation ◽

Test Case ◽

Automatic Test ◽

Prime Field ◽

Automatic Test Case Generation

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Search based techniques and mutation analysis in automatic test case generation: A survey

2015 IEEE International Advance Computing Conference (IACC) ◽

10.1109/iadcc.2015.7154816 ◽

2015 ◽

Author(s):

Meenu Dave ◽

Rashmi Agrawal

Keyword(s):

Mutation Analysis ◽

Test Case Generation ◽

Test Case ◽

Automatic Test ◽

Automatic Test Case Generation

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Automatic Test Case Generation for Concurrent Features from Natural Language Descriptions

Lecture Notes in Computer Science - Formal Methods: Foundations and Applications ◽

10.1007/978-3-030-03044-5_11 ◽

2018 ◽

pp. 163-179

Author(s):

Rafaela Almeida ◽

Sidney Nogueira ◽

Augusto Sampaio

Keyword(s):

Natural Language ◽

Test Case Generation ◽

Test Case ◽

Automatic Test ◽

Automatic Test Case Generation

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Implementing DDD for Automatic Test Case Generation

International Journal of Information and Education Technology ◽

10.18178/ijiet.2020.10.2.1349 ◽

2020 ◽

Vol 10 (2) ◽

pp. 117-121

Author(s):

Wacharapong Nachiengmai ◽

◽

Sakgasit Ramingwong ◽

Amphol Kongkeaw

Keyword(s):

Test Case Generation ◽

Test Case ◽

Automatic Test ◽

Automatic Test Case Generation

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UML-based Development Process for IEC 61499 with Automatic Test-case Generation

2006 IEEE Conference on Emerging Technologies and Factory Automation ◽

10.1109/etfa.2006.355407 ◽

2006 ◽

Author(s):

Tanvir Hussain ◽

Georg Frey

Keyword(s):

Development Process ◽

Test Case Generation ◽

Test Case ◽

Automatic Test ◽

Automatic Test Case Generation ◽

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Automatic Test Case Generation and Fault-Tolerant Framework Based on N-version and Recovery Block Mechanism

10.1007/978-981-16-3961-6_7 ◽

2021 ◽

pp. 65-74

Author(s):

Seema Rani ◽

Amandeep Kaur

Keyword(s):

Fault Tolerant ◽

Test Case Generation ◽

Test Case ◽

Automatic Test ◽

Automatic Test Case Generation ◽

Recovery Block ◽

Block Mechanism

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Case Study: Automatic Test Case Generation for a Secure Cache Implementation

Tests and Proofs - Lecture Notes in Computer Science ◽

10.1007/978-3-319-21215-9_4 ◽

2015 ◽

pp. 58-75 ◽

Author(s):

Roderick Bloem ◽

Daniel Hein ◽

Franz Röck ◽

Richard Schumi

Keyword(s):

Test Case Generation ◽

Test Case ◽

Automatic Test ◽

Automatic Test Case Generation

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