Automatic Test Case Generation for Prime Field Elliptic Curve Cryptographic Circuits

2021 IEEE 17th International Colloquium on Signal Processing & Its Applications (CSPA) ◽

10.1109/cspa52141.2021.9377300 ◽

2021 ◽

Author(s):

Krishn Kumar Gupt ◽

Meghana Kshirsagar ◽

Joseph P. Sullivan ◽

Conor Ryan

Keyword(s):

Elliptic Curve ◽

Test Case Generation ◽

Test Case ◽

Automatic Test ◽

Prime Field ◽

Automatic Test Case Generation

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Automatic Test Case Generation from Usage Information

2018 11th International Conference on the Quality of Information and Communications Technology (QUATIC) ◽

10.1109/quatic.2018.00047 ◽

2018 ◽

Cited By ~ 3

Author(s):

Pedro Silva ◽

Ana C. R. Paiva ◽

Andre Restivo ◽

Jorge Esparteiro Garcia

Keyword(s):

Test Case Generation ◽

Test Case ◽

Automatic Test ◽

Automatic Test Case Generation

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Search based techniques and mutation analysis in automatic test case generation: A survey

2015 IEEE International Advance Computing Conference (IACC) ◽

10.1109/iadcc.2015.7154816 ◽

2015 ◽

Cited By ~ 4

Author(s):

Meenu Dave ◽

Rashmi Agrawal

Keyword(s):

Mutation Analysis ◽

Test Case Generation ◽

Test Case ◽

Automatic Test ◽

Automatic Test Case Generation

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Automatic Test Case Generation for Concurrent Features from Natural Language Descriptions

Lecture Notes in Computer Science - Formal Methods: Foundations and Applications ◽

10.1007/978-3-030-03044-5_11 ◽

2018 ◽

pp. 163-179

Author(s):

Rafaela Almeida ◽

Sidney Nogueira ◽

Augusto Sampaio

Keyword(s):

Natural Language ◽

Test Case Generation ◽

Test Case ◽

Automatic Test ◽

Automatic Test Case Generation

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Implementing DDD for Automatic Test Case Generation

International Journal of Information and Education Technology ◽

10.18178/ijiet.2020.10.2.1349 ◽

2020 ◽

Vol 10 (2) ◽

pp. 117-121

Author(s):

Wacharapong Nachiengmai ◽

◽

Sakgasit Ramingwong ◽

Amphol Kongkeaw

Keyword(s):

Test Case Generation ◽

Test Case ◽

Automatic Test ◽

Automatic Test Case Generation

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UML-based Development Process for IEC 61499 with Automatic Test-case Generation

2006 IEEE Conference on Emerging Technologies and Factory Automation ◽

10.1109/etfa.2006.355407 ◽

2006 ◽

Cited By ~ 19

Author(s):

Tanvir Hussain ◽

Georg Frey

Keyword(s):

Development Process ◽

Test Case Generation ◽

Test Case ◽

Automatic Test ◽

Automatic Test Case Generation ◽

Iec 61499

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Automatic Test Case Generation and Fault-Tolerant Framework Based on N-version and Recovery Block Mechanism

10.1007/978-981-16-3961-6_7 ◽

2021 ◽

pp. 65-74

Author(s):

Seema Rani ◽

Amandeep Kaur

Keyword(s):

Fault Tolerant ◽

Test Case Generation ◽

Test Case ◽

Automatic Test ◽

Automatic Test Case Generation ◽

Recovery Block ◽

Block Mechanism

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Case Study: Automatic Test Case Generation for a Secure Cache Implementation

Tests and Proofs - Lecture Notes in Computer Science ◽

10.1007/978-3-319-21215-9_4 ◽

2015 ◽

pp. 58-75 ◽

Cited By ~ 2

Author(s):

Roderick Bloem ◽

Daniel Hein ◽

Franz Röck ◽

Richard Schumi

Keyword(s):

Test Case Generation ◽

Test Case ◽

Automatic Test ◽

Automatic Test Case Generation

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Functional gradient descent optimization for automatic test case generation for vehicle controllers

2017 13th IEEE Conference on Automation Science and Engineering (CASE) ◽

10.1109/coase.2017.8256245 ◽

2017 ◽

Cited By ~ 4

Author(s):

Cumhur Erkan Tuncali ◽

Shakiba Yaghoubi ◽

Theodore P. Pavlic ◽

Georgios Fainekos

Keyword(s):

Gradient Descent ◽

Test Case Generation ◽

Test Case ◽

Automatic Test ◽

Functional Gradient ◽

Automatic Test Case Generation ◽

Vehicle Controllers

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Automatic Test Case Generation from UML State Chart Diagram: A Survey

Lecture Notes in Electrical Engineering - Advanced Computer and Communication Engineering Technology ◽

10.1007/978-3-319-24584-3_12 ◽

2015 ◽

pp. 123-134 ◽

Cited By ~ 2

Author(s):

Yasir Dawood Salman ◽

Nor Laily Hashim

Keyword(s):

Test Case Generation ◽

Test Case ◽

Automatic Test ◽

Automatic Test Case Generation ◽

State Chart

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Analytic method for automatic test case generation for Function Block Diagram

2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) ◽

10.1109/etfa46521.2020.9212034 ◽

2020 ◽

Author(s):

Tomas Ausberger ◽

Karel Kubicek ◽

Pavla Medvecova ◽

Tomas Myslivec ◽

Milan Stetina

Keyword(s):

Block Diagram ◽

Test Case Generation ◽

Test Case ◽

Analytic Method ◽

Automatic Test ◽

Function Block ◽

Automatic Test Case Generation

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