A Platform for Backside Illuminated CMOS Image Sensors for UV and Visible Applications

2014 ◽  
Author(s):  
B. Vereecke ◽  
C. Cavaco ◽  
K. De Muynck ◽  
L. Haspeslagh ◽  
K. Minoglou ◽  
...  
Keyword(s):  
Image Sensors ◽  
Cmos Image Sensors ◽  
Backside Illuminated

Backside illuminated thinned CMOS image sensors for space imaging

2008 ◽  
Author(s):  
K Minoglou ◽  
K. De Munck ◽  
D.S. Tezcan ◽  
C. Van Hoof ◽  
P. De Moor ◽  
...  
Keyword(s):  
Image Sensors ◽  
Cmos Image Sensors ◽  
Backside Illuminated

Displacement Damage Effects in Backside Illuminated CMOS Image Sensors

2021 ◽  
pp. 1-8
Author(s):  
Bingkai Liu ◽  
Yudong Li ◽  
Lin Wen ◽  
Jinghao Zhao ◽  
Dong Zhou ◽  
...  
Keyword(s):  
Image Sensors ◽  
Displacement Damage ◽  
Cmos Image Sensors ◽  
Backside Illuminated

Hybrid backside illuminated CMOS image sensors possessing low crosstalk

2011 ◽  
Author(s):  
Padmakumar Ramachandra Rao ◽  
Koen De Munck ◽  
Kyriaki Minoglou ◽  
Joeri De Vos ◽  
Deniz Sabuncuoglu ◽  
...  
Keyword(s):  
Image Sensors ◽  
Cmos Image Sensors ◽  
Backside Illuminated

Displacement damage effects induced by fast neutron in backside-illuminated CMOS image sensors

2020 ◽  
Vol 57 (9) ◽  
pp. 1015-1021
Author(s):  
Xiang Zhang ◽  
Yudong Li ◽  
Lin Wen ◽  
Jie Feng ◽  
Dong Zhou ◽  
...  
Keyword(s):  
Fast Neutron ◽  
Image Sensors ◽  
Displacement Damage ◽  
Cmos Image Sensors ◽  
Backside Illuminated

scholarly journals Analysis of Dark Signal Degradation Caused by 1 MeV Neutron Irradiation on Backside‐Illuminated CMOS Image Sensors

2021 ◽  
Vol 30 (1) ◽  
pp. 180-184
Author(s):  
Liu Bingkai ◽  
Li Yudong ◽  
Wen Lin ◽  
Zhou Dong ◽  
Feng Jie ◽  
...  
Keyword(s):  
Neutron Irradiation ◽  
Image Sensors ◽  
Signal Degradation ◽  
Cmos Image Sensors ◽  
Dark Signal ◽  
Backside Illuminated

Effect of interfacial SiO2−y layer and defect in HfO2−x film on flat-band voltage of HfO2−x/SiO2−y stacks for backside-illuminated CMOS image sensors

2018 ◽  
Vol 124 (3) ◽  
Author(s):  
Heedo Na ◽  
Jimin Lee ◽  
Juyoung Jeong ◽  
Taeho Kim ◽  
Hyunchul Sohn
Keyword(s):  
Image Sensors ◽  
Flat Band ◽  
Flat Band Voltage ◽  
Cmos Image Sensors ◽  
Backside Illuminated

scholarly journals Study of dark current random telegraph signal in proton-irradiated backside illuminated CMOS image sensors

2020 ◽  
Vol 19 ◽  
pp. 103443
Author(s):  
Bingkai Liu ◽  
Yudong Li ◽  
Lin Wen ◽  
Dong Zhou ◽  
Jie Feng ◽  
...  
Keyword(s):  
Dark Current ◽  
Image Sensors ◽  
Random Telegraph Signal ◽  
Cmos Image Sensors ◽  
Backside Illuminated

Backside illuminated CMOS image sensors optimized by modeling and simulation

2011 ◽  
Vol 42 (11-13) ◽  
pp. 691-698 ◽  
Author(s):  
K. Minoglou ◽  
Padmakumar R. Rao ◽  
M. Rahman ◽  
K. De Munck ◽  
C. Van Hoof ◽  
...  
Keyword(s):  
Modeling And Simulation ◽  
Image Sensors ◽  
Cmos Image Sensors ◽  
Backside Illuminated
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