trace element variation
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2018 ◽  
Author(s):  
Calvin G. Barnes ◽  
◽  
Tania Babu ◽  
Kevin Werts ◽  
Vali Memeti ◽  
...  

2016 ◽  
Vol 31 (12) ◽  
pp. 2399-2409 ◽  
Author(s):  
Jia-Long Hao ◽  
Wei Yang ◽  
Yan Luo ◽  
Sen Hu ◽  
Qing-Zhu Yin ◽  
...  

We present a new method to measure trace element variation at the micron scale interface between zircon and melt. Two analytical modes (“grain mode” and “image mode”) were applied and shown as below.


2010 ◽  
Vol 14 (4) ◽  
pp. 345-358 ◽  
Author(s):  
Byeong-Jun Park ◽  
Yun-Deuk Jang ◽  
Chang-Oh Choo ◽  
Insung Lee ◽  
Jeong-Jin Kim

2008 ◽  
Vol 72 (6) ◽  
pp. 1034-1045 ◽  
Author(s):  
Sonia Castillo ◽  
Teresa Moreno ◽  
Xavier Querol ◽  
Andrés Alastuey ◽  
Emilio Cuevas ◽  
...  

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