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atomic force micro
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Photo-Conductivity Measurements of Single Line Structure of Poly(3-hexylthiophen) Patterned Film in Submicro-Meter Range by Conducting Atomic Force Micro scope.
KOBUNSHI RONBUNSHU
◽
10.1295/koron.59.651
◽
2002
◽
Vol 59
(10)
◽
pp. 651-655
Author(s):
Yuichi HASHIMOTO
◽
Tetsurou SAWADAISHI
◽
Kuniharu IMO
◽
Masatsugu SHIMOMURA
Keyword(s):
Atomic Force Micro
◽
Single Line
◽
Conductivity Measurements
◽
Line Structure
◽
Atomic Force
◽
Photo Conductivity
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Analysis of Adhesion Property of Photoresist Micro Pattern by Scanning Method of Micro Tip with Atomic Force Micro scope
Journal of The Adhesion Society of Japan
◽
10.11618/adhesion.36.2
◽
2000
◽
Vol 36
(1)
◽
pp. 2-9
Author(s):
Akira KAWAI
◽
Yoshiaki KAWAKAMI
Keyword(s):
Atomic Force Micro
◽
Adhesion Property
◽
Scanning Method
◽
Atomic Force
◽
Micro Pattern
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