1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium
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An Analysis Of The Fields On The Horizontal Coupling Plane In Esd Testing

1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium ◽

10.1109/eosesd.1997.634231 ◽

1997 ◽

Author(s):

S. Frei ◽

D. Pommerenke

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Grounding Personnel Via The Floor/footwear System

1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium ◽

10.1109/eosesd.1997.634240 ◽

1997 ◽

Author(s):

R. Gaertner ◽

K.-H. Helling ◽

G. Biermann ◽

E. Brazda ◽

R. Haberhauer ◽

...

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Analysis Of Esd Glove Use

1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium ◽

10.1109/eosesd.1997.634227 ◽

1997 ◽

Author(s):

G. Baumgartner

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Why The Human Body Capacitance Is So Large

1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium ◽

10.1109/eosesd.1997.634236 ◽

1997 ◽

Author(s):

Jiusheng Huang ◽

ZhanCheng Wu ◽

Shanghe Liu

Keyword(s):

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Characterization Of Esd Damaged Magnetoresistive Recording Heads

1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium ◽

10.1109/eosesd.1997.634267 ◽

1997 ◽

Author(s):

Chung F. Lam ◽

E. Salhi ◽

S. Chim

Keyword(s):

Recording Heads

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About The Different Methods Of Observing Esd

1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium ◽

10.1109/eosesd.1997.634233 ◽

1997 ◽

Author(s):

S. Frei ◽

D. Pomrnerenke

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Gate Burnout Of Small Signal Modfet's At Tlp Stress

1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium ◽

10.1109/eosesd.1997.634221 ◽

1997 ◽

Author(s):

V.A. Vashchenko ◽

J.B. Martynov ◽

V.F. Sinkevitch

Keyword(s):

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Esd Program Auditing: The Auditor's Perspective

1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium ◽

10.1109/eosesd.1997.634242 ◽

1997 ◽

Author(s):

T.L. Theis ◽

W.Y. McFarland ◽

R.A. Brin

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Influence Of Well Profile And Gate Length On The ESD Performance Of A Fully Silicided 0.25/spl mu/m Cmos Technology

1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium ◽

10.1109/eosesd.1997.634258 ◽

1997 ◽

Author(s):

K. Bock ◽

C. Russ ◽

G. Badenes ◽

G. Groeseneken ◽

L. Deferm

Keyword(s):

Cmos Technology ◽

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Field-induced Breakdown Esd Damage Of Magnetoresistive Recording Heads

1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium ◽

10.1109/eosesd.1997.634266 ◽

1997 ◽

Author(s):

A. Wallash ◽

M. Honda

Keyword(s):

Recording Heads

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