1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium
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(FIVE YEARS 0)

Published By IEEE

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An Analysis Of The Fields On The Horizontal Coupling Plane In Esd Testing

1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium ◽

10.1109/eosesd.1997.634231 ◽

1997 ◽

Cited By ~ 3

Author(s):

S. Frei ◽

D. Pommerenke

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Grounding Personnel Via The Floor/footwear System

1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium ◽

10.1109/eosesd.1997.634240 ◽

1997 ◽

Cited By ~ 5

Author(s):

R. Gaertner ◽

K.-H. Helling ◽

G. Biermann ◽

E. Brazda ◽

R. Haberhauer ◽

...

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Analysis Of Esd Glove Use

1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium ◽

10.1109/eosesd.1997.634227 ◽

1997 ◽

Cited By ~ 1

Author(s):

G. Baumgartner

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Why The Human Body Capacitance Is So Large

1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium ◽

10.1109/eosesd.1997.634236 ◽

1997 ◽

Cited By ~ 2

Author(s):

Jiusheng Huang ◽

ZhanCheng Wu ◽

Shanghe Liu

Keyword(s):

Human Body

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Characterization Of Esd Damaged Magnetoresistive Recording Heads

1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium ◽

10.1109/eosesd.1997.634267 ◽

1997 ◽

Author(s):

Chung F. Lam ◽

E. Salhi ◽

S. Chim

Keyword(s):

Recording Heads

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About The Different Methods Of Observing Esd

1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium ◽

10.1109/eosesd.1997.634233 ◽

1997 ◽

Cited By ~ 1

Author(s):

S. Frei ◽

D. Pomrnerenke

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Gate Burnout Of Small Signal Modfet's At Tlp Stress

1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium ◽

10.1109/eosesd.1997.634221 ◽

1997 ◽

Cited By ~ 1

Author(s):

V.A. Vashchenko ◽

J.B. Martynov ◽

V.F. Sinkevitch

Keyword(s):

Small Signal

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Procedures For The Design, Analysis And Auditing Of Static Camtrol Flooring/footwear Systems

1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium ◽

10.1109/eosesd.1997.634224 ◽

1997 ◽

Author(s):

L. From ◽

W.G. Klein ◽

S.L. Fowler

Keyword(s):

Design Analysis

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An Attempt To Explain Thermally Induced Soft Failures During Low Level Esd Stresses: Study Of The Differences Between Soft And Hard Nmos Failures.

1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium ◽

10.1109/eosesd.1997.634261 ◽

1997 ◽

Cited By ~ 10

Author(s):

P. Salome ◽

C. Leroux ◽

D. Mariolle ◽

D. Lafond ◽

J.P. Chante ◽

...

Keyword(s):

Thermally Induced ◽

Low Level

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Decay-time Use With Characterization Magnetoresistive Of Esd Materials For Recording Heads

1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium ◽

10.1109/eosesd.1997.634265 ◽

1997 ◽

Author(s):

Chung F. Lam ◽

C. Chang

Keyword(s):

Time Use ◽

Decay Time ◽

Recording Heads

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1996 Proceedings Electrical Overstress/Electrostatic Discharge SymposiumLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

An Analysis Of The Fields On The Horizontal Coupling Plane In Esd Testing

Grounding Personnel Via The Floor/footwear System

Analysis Of Esd Glove Use

Why The Human Body Capacitance Is So Large

Characterization Of Esd Damaged Magnetoresistive Recording Heads

About The Different Methods Of Observing Esd

Gate Burnout Of Small Signal Modfet's At Tlp Stress

Procedures For The Design, Analysis And Auditing Of Static Camtrol Flooring/footwear Systems

An Attempt To Explain Thermally Induced Soft Failures During Low Level Esd Stresses: Study Of The Differences Between Soft And Hard Nmos Failures.

Decay-time Use With Characterization Magnetoresistive Of Esd Materials For Recording Heads

1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium
Latest Publications