2009 First International Conference on Advances in System Testing and Validation Lifecycle
Latest Publications

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Published By IEEE

9781424448623

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Reviewers

2009 First International Conference on Advances in System Testing and Validation Lifecycle ◽

10.1109/valid.2009.6 ◽

2009 ◽

Organizing Committee

2009 First International Conference on Advances in System Testing and Validation Lifecycle ◽

10.1109/valid.2009.5 ◽

2009 ◽

Validating the Behavioral Equivalence of TTCN-3 Test Cases

2009 First International Conference on Advances in System Testing and Validation Lifecycle ◽

10.1109/valid.2009.13 ◽

2009 ◽

Cited By ~ 3

Author(s):

Philip Makedonski ◽

Jens Grabowski ◽

Helmut Neukirchen

Keyword(s):

Test Cases ◽

Behavioral Equivalence

Tracing Requirements in a Model-Based Testing Approach

2009 First International Conference on Advances in System Testing and Validation Lifecycle ◽

10.1109/valid.2009.15 ◽

2009 ◽

Cited By ~ 11

Author(s):

Fredrik Abbors ◽

Dragos Truscan ◽

Johan Lilius

Keyword(s):

Model Based ◽

Model Based Testing ◽

Testing Approach

A High-Level Language and Compiler to Configure the Multi-core Debug Solution (MCDS)

2009 First International Conference on Advances in System Testing and Validation Lifecycle ◽

10.1109/valid.2009.18 ◽

2009 ◽

Cited By ~ 1

Author(s):

Jens Braunes ◽

Rainer G. Spallek

Keyword(s):

High Level Language ◽

High Level

Integration Test Order Strategies to Consider Test Focus and Simulation Effort

2009 First International Conference on Advances in System Testing and Validation Lifecycle ◽

10.1109/valid.2009.30 ◽

2009 ◽

Cited By ~ 7

Author(s):

Lars Borner ◽

Barbara Paech

Keyword(s):

Integration Test ◽

Test Order

SAT-Based On-Line Fault Isolation in Serial Systems

2009 First International Conference on Advances in System Testing and Validation Lifecycle ◽

10.1109/valid.2009.9 ◽

2009 ◽

Author(s):

Jinseong Jeon ◽

Sangwon Kim ◽

Dongkeun Lee

Keyword(s):

Fault Isolation ◽

On Line

[Cover art]

2009 First International Conference on Advances in System Testing and Validation Lifecycle ◽

10.1109/valid.2009.37 ◽

2009 ◽

Keyword(s):

Cover Art

Is Depth of Inheritance Tree a Good Cost Prediction for Branch Coverage Testing?

2009 First International Conference on Advances in System Testing and Validation Lifecycle ◽

10.1109/valid.2009.11 ◽

2009 ◽

Cited By ~ 2

Author(s):

Muhammad Rabee Shaheen ◽

Lydie du Bousquet

Keyword(s):

Cost Prediction ◽

Branch Coverage ◽

Coverage Testing

Scenario-Based Test Case Generation Using Event-B Models

2009 First International Conference on Advances in System Testing and Validation Lifecycle ◽

10.1109/valid.2009.22 ◽

2009 ◽

Cited By ~ 4

Author(s):

Q.A. Malik ◽

J. Lilius ◽

L. Laibinis

Keyword(s):

Test Case Generation ◽

Test Case

2009 First International Conference on Advances in System Testing and Validation LifecycleLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Reviewers

Organizing Committee

Validating the Behavioral Equivalence of TTCN-3 Test Cases

Tracing Requirements in a Model-Based Testing Approach

A High-Level Language and Compiler to Configure the Multi-core Debug Solution (MCDS)

Integration Test Order Strategies to Consider Test Focus and Simulation Effort

SAT-Based On-Line Fault Isolation in Serial Systems

[Cover art]

Is Depth of Inheritance Tree a Good Cost Prediction for Branch Coverage Testing?

Scenario-Based Test Case Generation Using Event-B Models

2009 First International Conference on Advances in System Testing and Validation Lifecycle
Latest Publications