Circuit Design for Reliability
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Published By Springer New York

9781461440772, 9781461440789
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

On-Chip Characterization of Statistical Device Degradation

2014 ◽  
pp. 69-92
Author(s):  
Takashi Sato ◽  
Hiromitsu Awano
Keyword(s):  
On Chip

Circuit Resilience Roadmap

2014 ◽  
pp. 121-143
Author(s):  
Veit B. Kleeberger ◽  
Christian Weis ◽  
Ulf Schlichtmann ◽  
Norbert Wehn

Atomistic Simulations on Reliability

2014 ◽  
pp. 47-67
Author(s):  
Dragica Vasileska ◽  
Nabil Ashraf
Keyword(s):  
Atomistic Simulations

Variability-Aware Clock Design

2014 ◽  
pp. 255-272
Author(s):  
Matthew R. Guthaus ◽  
Gustavo Wilke

Introduction

2014 ◽  
pp. 1-4
Author(s):  
Ricardo Reis ◽  
Yu Cao ◽  
Gilson Wirth

Recent Trends in Bias Temperature Instability

2014 ◽  
pp. 5-19
Author(s):  
B. Kaczer ◽  
T. Grasser ◽  
J. Franco ◽  
M. Toledano-Luque ◽  
J. Roussel ◽  
...  
Keyword(s):  
Temperature Instability ◽  
Bias Temperature Instability ◽  
Recent Trends

Layout Aware Electromigration Analysis of Power/Ground Networks

2014 ◽  
pp. 145-173 ◽  
Author(s):  
Di-an Li ◽  
Malgorzata Marek-Sadowska ◽  
Sani R. Nassif
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