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2016 IEEE 25th North Atlantic Test Workshop (NATW)
Latest Publications
TOTAL DOCUMENTS
21
(FIVE YEARS 0)
H-INDEX
2
(FIVE YEARS 0)
Published By IEEE
9781467389495
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Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
Related Keywords
Using Existing Reconfigurable Logic in 3D Die Stacks for Test
2016 IEEE 25th North Atlantic Test Workshop (NATW)
◽
10.1109/natw.2016.15
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2016
◽
Cited By ~ 2
Author(s):
Fanchen Zhang
◽
Yi Sun
◽
Xi Shen
◽
Kundan Nepal
◽
Jennifer Dworak
◽
...
Keyword(s):
Reconfigurable Logic
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A 100MS/s 10-bit Split-SAR ADC with Capacitor Mismatch Compensation Using Built-In Calibration
2016 IEEE 25th North Atlantic Test Workshop (NATW)
◽
10.1109/natw.2016.9
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2016
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Cited By ~ 1
Author(s):
Yongsuk Choi
◽
Yong-Bin Kim
◽
In-Seok Jung
Keyword(s):
Sar Adc
◽
Capacitor Mismatch
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RAPIDO Testing and Modeling of Assisted Write and Read Operations for SRAMs
2016 IEEE 25th North Atlantic Test Workshop (NATW)
◽
10.1109/natw.2016.14
◽
2016
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Cited By ~ 1
Author(s):
Joseph Nguyen
◽
David Turgis
◽
David Bonciani
◽
Brice Lhomme
◽
Yann Carminati
◽
...
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Case Study of Testing a SoC Design with Mixed EDT Channel Sharing and Channel Broadcasting
2016 IEEE 25th North Atlantic Test Workshop (NATW)
◽
10.1109/natw.2016.10
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2016
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Cited By ~ 6
Author(s):
Xiao Liu
◽
Changkai Yu
◽
Yu Qi
◽
Yu Huang
◽
James Fu
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Table of Contents
2016 IEEE 25th North Atlantic Test Workshop (NATW)
◽
10.1109/natw.2016.8
◽
2016
◽
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Enabling Debug in IoT Wireless Development and Deployment with Security Considerations
2016 IEEE 25th North Atlantic Test Workshop (NATW)
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10.1109/natw.2016.16
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2016
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Cited By ~ 1
Author(s):
Amirhossein Shahshahani
◽
Andrey Tolstikhin
◽
Zeljko Zilic
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Title Page i
2016 IEEE 25th North Atlantic Test Workshop (NATW)
◽
10.1109/natw.2016.1
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2016
◽
Keyword(s):
Title Page
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Program Committee
2016 IEEE 25th North Atlantic Test Workshop (NATW)
◽
10.1109/natw.2016.6
◽
2016
◽
Keyword(s):
Program Committee
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Steering Committee
2016 IEEE 25th North Atlantic Test Workshop (NATW)
◽
10.1109/natw.2016.7
◽
2016
◽
Keyword(s):
Steering Committee
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Automated and Reusable IP Functional Test Rule Development across Multiple IP Instances within and across Asic Designs
2016 IEEE 25th North Atlantic Test Workshop (NATW)
◽
10.1109/natw.2016.13
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2016
◽
Author(s):
Malinky Ghosh
◽
Kelly Ockunzzi
Keyword(s):
Functional Test
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