Frontiers in Electronic Testing - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
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Published By Kluwer Academic Publishers

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Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Model-Based Analog and Mixed-Signal Test

Frontiers in Electronic Testing - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits ◽

10.1007/0-306-47040-3_11 ◽

2006 ◽

pp. 385-416

Keyword(s):

Mixed Signal ◽

Model Based

Boundary Scan Standard

Frontiers in Electronic Testing - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits ◽

10.1007/0-306-47040-3_16 ◽

2006 ◽

pp. 549-574

Keyword(s):

Boundary Scan

Sequential Circuit Test Generation

Frontiers in Electronic Testing - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits ◽

10.1007/0-306-47040-3_8 ◽

2006 ◽

pp. 211-252

Keyword(s):

Test Generation ◽

Sequential Circuit

Testability Measures

Frontiers in Electronic Testing - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits ◽

10.1007/0-306-47040-3_6 ◽

2006 ◽

pp. 129-154

Keyword(s):

Testability Measures

VLSI Testing Process and Test Equipment

Frontiers in Electronic Testing - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits ◽

10.1007/0-306-47040-3_2 ◽

2006 ◽

pp. 17-34

Keyword(s):

Test Equipment ◽

Vlsi Testing

Digital DFT and Scan Design

Frontiers in Electronic Testing - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits ◽

10.1007/0-306-47040-3_14 ◽

2006 ◽

pp. 465-488

Keyword(s):

Scan Design

System Test and Core-Based Design

Frontiers in Electronic Testing - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits ◽

10.1007/0-306-47040-3_18 ◽

2006 ◽

pp. 595-612

IDDQ Test

Frontiers in Electronic Testing - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits ◽

10.1007/0-306-47040-3_13 ◽

2006 ◽

pp. 439-462

Fault Modeling

Frontiers in Electronic Testing - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits ◽

10.1007/0-306-47040-3_4 ◽

2006 ◽

pp. 57-80

Keyword(s):

Fault Modeling