Proceedings. International Test Conference
Latest Publications

TOTAL DOCUMENTS

181

(FIVE YEARS 0)

H-INDEX

31

(FIVE YEARS 0)

Published By IEEE

0780375424

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Is board test worth talking about?

Proceedings. International Test Conference ◽

10.1109/test.2002.1041936 ◽

2005 ◽

Author(s):

B. Eklow

Keyword(s):

Board Test

Board test: wanted dead or alive

Proceedings. International Test Conference ◽

10.1109/test.2002.1041937 ◽

2005 ◽

Author(s):

G.D. Robinson

Keyword(s):

Board Test

Is ITC bored with board test?

Proceedings. International Test Conference ◽

10.1109/test.2002.1041938 ◽

2005 ◽

Cited By ~ 1

Author(s):

K.M. Butler

Keyword(s):

Board Test

Panel: "board test and ITC: what does the future hold?"

Proceedings. International Test Conference ◽

10.1109/test.2002.1041940 ◽

2005 ◽

Author(s):

M. Lobetti-Bodoni

Keyword(s):

Board Test ◽

The Future

Board test is not mature

Proceedings. International Test Conference ◽

10.1109/test.2002.1041939 ◽

2005 ◽

Author(s):

K.P. Parker

Keyword(s):

Board Test

A persistent diagnostic technique for unstable defects

Proceedings. International Test Conference ◽

10.1109/test.2002.1041766 ◽

2003 ◽

Cited By ~ 65

Author(s):

Y. Sato ◽

L. Yamazaki ◽

H. Yamanaka ◽

T. Ikeda ◽

M. Takakura

Keyword(s):

Diagnostic Technique

Scan-based testing: the only practical solution for testing ASIC/consumer products

Proceedings. International Test Conference ◽

10.1109/test.2002.1041905 ◽

2003 ◽

Cited By ~ 4

Author(s):

P. Nigh

Keyword(s):

Consumer Products ◽

Practical Solution

An embedded core for sub-picosecond timing measurements

Proceedings. International Test Conference ◽

10.1109/test.2002.1041753 ◽

2003 ◽

Cited By ~ 15

Author(s):

S. Tabatabaei ◽

A. Ivanov

Outsourcing test without standards?

Proceedings. International Test Conference ◽

10.1109/test.2002.1041921 ◽

2003 ◽

Author(s):

P. Muhmenthaler

Verifying properties using sequential ATPG [IC design]

Proceedings. International Test Conference ◽

10.1109/test.2002.1041761 ◽

2003 ◽

Cited By ~ 19

Author(s):

J.A. Abraham ◽

V.M. Vedula

Keyword(s):

Ic Design