Proceedings. International Test Conference
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TOTAL DOCUMENTS

181

(FIVE YEARS 0)

H-INDEX

31

(FIVE YEARS 0)

Published By IEEE

0780375424

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Is board test worth talking about?

Proceedings. International Test Conference ◽

10.1109/test.2002.1041936 ◽

2005 ◽

Author(s):

B. Eklow

Keyword(s):

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Is ITC bored with board test?

Proceedings. International Test Conference ◽

10.1109/test.2002.1041938 ◽

2005 ◽

Author(s):

K.M. Butler

Keyword(s):

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Board test: wanted dead or alive

Proceedings. International Test Conference ◽

10.1109/test.2002.1041937 ◽

2005 ◽

Author(s):

G.D. Robinson

Keyword(s):

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Panel: "board test and ITC: what does the future hold?"

Proceedings. International Test Conference ◽

10.1109/test.2002.1041940 ◽

2005 ◽

Author(s):

M. Lobetti-Bodoni

Keyword(s):

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Board test is not mature

Proceedings. International Test Conference ◽

10.1109/test.2002.1041939 ◽

2005 ◽

Author(s):

K.P. Parker

Keyword(s):

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A DFT technique for low frequency delay fault testing in high performance digital circuits

Proceedings. International Test Conference ◽

10.1109/test.2002.1041870 ◽

2003 ◽

Author(s):

B. Chatterjee ◽

M. Sachdev ◽

A. Keshavarzi

Keyword(s):

High Performance ◽

Digital Circuits ◽

Low Frequency ◽

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing

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Isolating and removing sources of variation in test data

Proceedings. International Test Conference ◽

10.1109/test.2002.1041796 ◽

2003 ◽

Author(s):

D. Turner ◽

D. Abercrombie ◽

J. McNames ◽

R. Daasch ◽

R. Madge

Keyword(s):

Test Data ◽

Sources Of Variation

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Embedded deterministic test for low cost manufacturing test

Proceedings. International Test Conference ◽

10.1109/test.2002.1041773 ◽

2003 ◽

Author(s):

J. Rajski ◽

J. Tyszer ◽

M. Kassab ◽

N. Mukherjee ◽

R. Thompson ◽

...

Keyword(s):

Low Cost ◽

Manufacturing Test ◽

Low Cost Manufacturing

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An implementation of IEEE 1149.1 to avoid timing violations and other practical in-compliance improvements

Proceedings. International Test Conference ◽

10.1109/test.2002.1041827 ◽

2003 ◽

Author(s):

D. Stang ◽

R. Dandapani

Keyword(s):

Ieee 1149.1 ◽

Timing Violations

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An embedded core for sub-picosecond timing measurements

Proceedings. International Test Conference ◽

10.1109/test.2002.1041753 ◽

2003 ◽

Author(s):

S. Tabatabaei ◽

A. Ivanov

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