Proceedings of the Fourth Asian Test Symposium
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59

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Published By IEEE Comput. Soc. Press

0818671297

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Transistor leakage fault location with I/sub DDQ/ measurement

Proceedings of the Fourth Asian Test Symposium ◽

10.1109/ats.1995.485316 ◽

2002 ◽

Cited By ~ 1

Author(s):

Wen Xiaoqing ◽

H. Tamamoto ◽

K. Kinoshita

Keyword(s):

Fault Location

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Hardware-accelerated concurrent fault simulation: eventflow computing versus dataflow computing

Proceedings of the Fourth Asian Test Symposium ◽

10.1109/ats.1995.485324 ◽

2002 ◽

Author(s):

W. Hahn ◽

A. Hagerer ◽

R. Kandlbinder

Keyword(s):

Fault Simulation ◽

Dataflow Computing ◽

Concurrent Fault Simulation

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Serial transistor network modeling for bridging fault simulation

Proceedings of the Fourth Asian Test Symposium ◽

10.1109/ats.1995.485323 ◽

2002 ◽

Cited By ~ 1

Author(s):

M. Renovell ◽

P. Huc ◽

Y. Bertrand

Keyword(s):

Network Modeling ◽

Fault Simulation ◽

Bridging Fault

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A simple technique for locating gate-level faults in combinational circuits

Proceedings of the Fourth Asian Test Symposium ◽

10.1109/ats.1995.485318 ◽

2002 ◽

Cited By ~ 4

Author(s):

T. Yamada ◽

K. Yamazaki ◽

E.J. McCluskey

Keyword(s):

Simple Technique ◽

Combinational Circuits

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Distributed off-line testing of parallel systems

Proceedings of the Fourth Asian Test Symposium ◽

10.1109/ats.1995.485308 ◽

2002 ◽

Author(s):

O. Benkahla ◽

C. Aktouf ◽

C. Robach

Keyword(s):

Parallel Systems

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A cellular array designed from a Multiple-valued Decision Diagram and its fault tests

Proceedings of the Fourth Asian Test Symposium ◽

10.1109/ats.1995.485311 ◽

2002 ◽

Cited By ~ 3

Author(s):

N. Kamiura ◽

Y. Hata ◽

K. Yamato

Keyword(s):

Cellular Array

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Test sequence compaction by reduced scan shift and retiming

Proceedings of the Fourth Asian Test Symposium ◽

10.1109/ats.1995.485333 ◽

2002 ◽

Cited By ~ 4

Author(s):

Y. Higami ◽

S. Kajihara ◽

K. Kinoshita

Keyword(s):

Test Sequence

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Test configurations to enhance the testability of sequential circuits

Proceedings of the Fourth Asian Test Symposium ◽

10.1109/ats.1995.485332 ◽

2002 ◽

Author(s):

S. Lavabre ◽

Y. Bertrand ◽

M. Renovell ◽

C. Landrault

Keyword(s):

Sequential Circuits

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Exploitation of parallelism in group probing for testing massively parallel processing systems

Proceedings of the Fourth Asian Test Symposium ◽

10.1109/ats.1995.485310 ◽

2002 ◽

Author(s):

Y.-H. Choi ◽

C. Kim

Keyword(s):

Parallel Processing ◽

Massively Parallel ◽

Massively Parallel Processing

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Testable design of non-scan sequential circuits using extra logic

Proceedings of the Fourth Asian Test Symposium ◽

10.1109/ats.1995.485334 ◽

2002 ◽

Cited By ~ 13

Author(s):

D.K. Das ◽

B.B. Bhattacharya

Keyword(s):

Sequential Circuits ◽

Testable Design

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