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Proceedings of the Fourth Asian Test Symposium
Latest Publications
TOTAL DOCUMENTS
59
(FIVE YEARS 0)
H-INDEX
8
(FIVE YEARS 0)
Published By IEEE Comput. Soc. Press
0818671297
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Latest Documents
Most Cited Documents
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Hardware-accelerated concurrent fault simulation: eventflow computing versus dataflow computing
Proceedings of the Fourth Asian Test Symposium
◽
10.1109/ats.1995.485324
◽
2002
◽
Author(s):
W. Hahn
◽
A. Hagerer
◽
R. Kandlbinder
Keyword(s):
Fault Simulation
◽
Dataflow Computing
◽
Concurrent Fault Simulation
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Transistor leakage fault location with I/sub DDQ/ measurement
Proceedings of the Fourth Asian Test Symposium
◽
10.1109/ats.1995.485316
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2002
◽
Cited By ~ 1
Author(s):
Wen Xiaoqing
◽
H. Tamamoto
◽
K. Kinoshita
Keyword(s):
Fault Location
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Serial transistor network modeling for bridging fault simulation
Proceedings of the Fourth Asian Test Symposium
◽
10.1109/ats.1995.485323
◽
2002
◽
Cited By ~ 1
Author(s):
M. Renovell
◽
P. Huc
◽
Y. Bertrand
Keyword(s):
Network Modeling
◽
Fault Simulation
◽
Bridging Fault
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A simple technique for locating gate-level faults in combinational circuits
Proceedings of the Fourth Asian Test Symposium
◽
10.1109/ats.1995.485318
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2002
◽
Cited By ~ 4
Author(s):
T. Yamada
◽
K. Yamazaki
◽
E.J. McCluskey
Keyword(s):
Simple Technique
◽
Combinational Circuits
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A cellular array designed from a Multiple-valued Decision Diagram and its fault tests
Proceedings of the Fourth Asian Test Symposium
◽
10.1109/ats.1995.485311
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2002
◽
Cited By ~ 3
Author(s):
N. Kamiura
◽
Y. Hata
◽
K. Yamato
Keyword(s):
Cellular Array
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Distributed off-line testing of parallel systems
Proceedings of the Fourth Asian Test Symposium
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10.1109/ats.1995.485308
◽
2002
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Author(s):
O. Benkahla
◽
C. Aktouf
◽
C. Robach
Keyword(s):
Parallel Systems
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Exploitation of parallelism in group probing for testing massively parallel processing systems
Proceedings of the Fourth Asian Test Symposium
◽
10.1109/ats.1995.485310
◽
2002
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Author(s):
Y.-H. Choi
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C. Kim
Keyword(s):
Parallel Processing
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Massively Parallel
◽
Massively Parallel Processing
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Testable design of non-scan sequential circuits using extra logic
Proceedings of the Fourth Asian Test Symposium
◽
10.1109/ats.1995.485334
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2002
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Cited By ~ 13
Author(s):
D.K. Das
◽
B.B. Bhattacharya
Keyword(s):
Sequential Circuits
◽
Testable Design
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Metastability evaluation method by propagation delay distribution measurement
Proceedings of the Fourth Asian Test Symposium
◽
10.1109/ats.1995.485314
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2002
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Cited By ~ 2
Author(s):
B.M. Rogina
◽
B. Vojnovic
Keyword(s):
Evaluation Method
◽
Propagation Delay
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Distribution Measurement
◽
Delay Distribution
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Test sequence compaction by reduced scan shift and retiming
Proceedings of the Fourth Asian Test Symposium
◽
10.1109/ats.1995.485333
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2002
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Cited By ~ 4
Author(s):
Y. Higami
◽
S. Kajihara
◽
K. Kinoshita
Keyword(s):
Test Sequence
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