Influence of Tempemture on Microelectronics and System Reliability
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9780138750879
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Temperature as a Reliability Factor

2020 ◽  
pp. 1-12
Author(s):  
Pradeep Lall ◽  
Michael G. Pecht ◽  
Edward B. Hakim
Keyword(s):  
Reliability Factor

A Physics-of-Failure Approach to IC Burn-In

2020 ◽  
pp. 183-194
Author(s):  
Pradeep Lall ◽  
Michael G. Pecht ◽  
Edward B. Hakim
Keyword(s):  
Physics Of Failure

Conclusions

2020 ◽  
pp. 243-246
Author(s):  
Pradeep Lall ◽  
Michael G. Pecht ◽  
Edward B. Hakim
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