Point Defects in Semiconductors and Insulators - Springer Series in Materials Science
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Published By Springer Berlin Heidelberg

9783642627224, 9783642556159

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Electrical Detection of Electron Paramagnetic Resonance

Point Defects in Semiconductors and Insulators - Springer Series in Materials Science ◽

10.1007/978-3-642-55615-9_7 ◽

2003 ◽

pp. 265-308

Author(s):

Johann-Martin Spaeth ◽

Harald Overhof

Keyword(s):

Electron Paramagnetic Resonance ◽

Electrical Detection ◽

Paramagnetic Resonance ◽

Electron Paramagnetic

Electron Nuclear Double Resonance

Point Defects in Semiconductors and Insulators - Springer Series in Materials Science ◽

10.1007/978-3-642-55615-9_5 ◽

2003 ◽

pp. 163-195

Author(s):

Johann-Martin Spaeth ◽

Harald Overhof

Keyword(s):

Double Resonance ◽

Electron Nuclear Double Resonance

Optical Detection of Electron Paramagnetic Resonance

Point Defects in Semiconductors and Insulators - Springer Series in Materials Science ◽

10.1007/978-3-642-55615-9_4 ◽

2003 ◽

pp. 75-162

Author(s):

Johann-Martin Spaeth ◽

Harald Overhof

Keyword(s):

Electron Paramagnetic Resonance ◽

Optical Detection ◽

Paramagnetic Resonance ◽

Electron Paramagnetic

Electron Paramagnetic Resonance Spectra

Point Defects in Semiconductors and Insulators - Springer Series in Materials Science ◽

10.1007/978-3-642-55615-9_3 ◽

2003 ◽

pp. 35-73 ◽

Cited By ~ 5

Author(s):

Johann-Martin Spaeth ◽

Harald Overhof

Keyword(s):

Electron Paramagnetic Resonance ◽

Paramagnetic Resonance ◽

Electron Paramagnetic

Introduction

Point Defects in Semiconductors and Insulators - Springer Series in Materials Science ◽

10.1007/978-3-642-55615-9_1 ◽

2003 ◽

pp. 1-10

Author(s):

Johann-Martin Spaeth ◽

Harald Overhof

Experimental Aspects of Optically Detected EPR and ENDOR

Point Defects in Semiconductors and Insulators - Springer Series in Materials Science ◽

10.1007/978-3-642-55615-9_9 ◽

2003 ◽

pp. 415-442

Author(s):

Johann-Martin Spaeth ◽

Harald Overhof

Keyword(s):

Optically Detected

Theoretical ab initio Calculations of Hyperfine Interactions

Point Defects in Semiconductors and Insulators - Springer Series in Materials Science ◽

10.1007/978-3-642-55615-9_8 ◽

2003 ◽

pp. 309-413

Author(s):

Johann-Martin Spaeth ◽

Harald Overhof

Keyword(s):

Ab Initio Calculations ◽

Ab Initio ◽

Hyperfine Interactions

Analysis of ENDOR Spectra

Point Defects in Semiconductors and Insulators - Springer Series in Materials Science ◽

10.1007/978-3-642-55615-9_6 ◽

2003 ◽

pp. 197-264

Author(s):

Johann-Martin Spaeth ◽

Harald Overhof

Fundamentals of Electron Paramagnetic Resonance

Point Defects in Semiconductors and Insulators - Springer Series in Materials Science ◽

10.1007/978-3-642-55615-9_2 ◽

2003 ◽

pp. 11-33 ◽

Cited By ~ 1

Author(s):

Johann-Martin Spaeth ◽

Harald Overhof

Keyword(s):

Electron Paramagnetic Resonance ◽

Paramagnetic Resonance ◽

Electron Paramagnetic

Point Defects in Semiconductors and Insulators - Springer Series in Materials ScienceLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Berlin Heidelberg

Electrical Detection of Electron Paramagnetic Resonance

Electron Nuclear Double Resonance

Optical Detection of Electron Paramagnetic Resonance

Electron Paramagnetic Resonance Spectra

Introduction

Experimental Aspects of Optically Detected EPR and ENDOR

Theoretical ab initio Calculations of Hyperfine Interactions

Analysis of ENDOR Spectra

Fundamentals of Electron Paramagnetic Resonance

Point Defects in Semiconductors and Insulators - Springer Series in Materials Science
Latest Publications