Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium
Latest Publications

TOTAL DOCUMENTS

62

(FIVE YEARS 0)

H-INDEX

9

(FIVE YEARS 0)

Published By IEEE Comput. Soc. Press

0818638303

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Design SRAMs for burn-in

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium ◽

10.1109/vtest.1993.313330 ◽

2002 ◽

Author(s):

W. Reohr ◽

Yuen Chan ◽

D. Plass ◽

A. Pelella ◽

P. Wu

Download Full-text

Generation of testable designs from behavioral descriptions using high level synthesis tools

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium ◽

10.1109/vtest.1993.313337 ◽

2002 ◽

Author(s):

K.K. Varma ◽

P. Vishakantaiah ◽

J.A. Abraham

Keyword(s):

High Level Synthesis ◽

Download Full-text

Time and space correlated errors in signature analysis

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium ◽

10.1109/vtest.1993.313357 ◽

2002 ◽

Author(s):

G. Edirisooriya ◽

S. Edirisooriya ◽

J.P. Robinson

Keyword(s):

Signature Analysis ◽

Correlated Errors ◽

Download Full-text

Minimal hardware multiple signature analysis for BIST

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium ◽

10.1109/vtest.1993.313314 ◽

2002 ◽

Author(s):

Yuejian Wu ◽

A. Ivanov

Keyword(s):

Signature Analysis ◽

Minimal Hardware

Download Full-text

Signal probability calculations using partial functional manipulation

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium ◽

10.1109/vtest.1993.313324 ◽

2002 ◽

Author(s):

R. Kodavarti ◽

D.E. Ross

Keyword(s):

Signal Probability

Download Full-text

An IEEE 1149.1 based voltmeter/oscilloscope in a chip

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium ◽

10.1109/vtest.1993.313310 ◽

2002 ◽

Author(s):

L. Whetsel

Keyword(s):

Download Full-text

Analysis of redundant structures in combinational circuits

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium ◽

10.1109/vtest.1993.313313 ◽

2002 ◽

Author(s):

E. Isern ◽

J. Figueras

Keyword(s):

Combinational Circuits

Download Full-text

Computer-aided failure analysis of VLSI circuits using I/sub DDQ/ testing

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium ◽

10.1109/vtest.1993.313300 ◽

2002 ◽

Author(s):

S. Naik ◽

W. Maly

Keyword(s):

Failure Analysis ◽

Vlsi Circuits ◽

Download Full-text

Explorations of sequential ATPG using Boolean satisfiability

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium ◽

10.1109/vtest.1993.313303 ◽

2002 ◽

Author(s):

H. Konuk ◽

T. Larrabee

Keyword(s):

Boolean Satisfiability

Download Full-text

Classification of bridging faults in CMOS circuits: experimental results and implications for test

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium ◽

10.1109/vtest.1993.313298 ◽

2002 ◽

Author(s):

S.F. Midkiff ◽

S.W. Bollinger

Keyword(s):

Experimental Results ◽

Cmos Circuits ◽

Bridging Faults

Download Full-text