A Review: Ultrahigh-Vacuum Technology for Electron Microscopes
Latest Publications

TOTAL DOCUMENTS

26

(FIVE YEARS 26)

H-INDEX

0

(FIVE YEARS 0)

Published By Elsevier

9780128185735

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Copyright

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes ◽

10.1016/b978-0-12-818573-5.00016-5 ◽

2020 ◽

pp. iv

Download Full-text

Methods for measuring outgassing rates

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes ◽

10.1016/b978-0-12-818573-5.00003-7 ◽

2020 ◽

pp. 77-115

Author(s):

Nagamitsu Yoshimura

Download Full-text

Characteristics of outgassing from metal surfaces

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes ◽

10.1016/b978-0-12-818573-5.00002-5 ◽

2020 ◽

pp. 27-76

Author(s):

Nagamitsu Yoshimura

Keyword(s):

Download Full-text

Molecular-flow conductance and gas-flow patterns

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes ◽

10.1016/b978-0-12-818573-5.00005-0 ◽

2020 ◽

pp. 179-193

Author(s):

Nagamitsu Yoshimura

Keyword(s):

Gas Flow ◽

Flow Patterns ◽

Download Full-text

Phenomena occurred in electron microscopes

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes ◽

10.1016/b978-0-12-818573-5.00023-2 ◽

2020 ◽

pp. 287

Author(s):

Nagamitsu Yoshimura

Keyword(s):

Electron Microscopes

Download Full-text

About the author

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes ◽

10.1016/b978-0-12-818573-5.00026-8 ◽

2020 ◽

pp. xxi

Download Full-text

Phenomena induced by fine electron-probe irradiation

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes ◽

10.1016/b978-0-12-818573-5.00009-8 ◽

2020 ◽

pp. 311-356

Author(s):

Nagamitsu Yoshimura

Keyword(s):

Download Full-text

Total and partial pressure gauges for ultrahigh-vacuum use

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes ◽

10.1016/b978-0-12-818573-5.00006-2 ◽

2020 ◽

pp. 195-239

Author(s):

Nagamitsu Yoshimura

Keyword(s):

Partial Pressure ◽

Ultrahigh Vacuum

Download Full-text

Micro-discharges in high vacuum

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes ◽

10.1016/b978-0-12-818573-5.00010-4 ◽

2020 ◽

pp. 357-419

Author(s):

Nagamitsu Yoshimura

Keyword(s):

Download Full-text

Index

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes ◽

10.1016/b978-0-12-818573-5.00020-7 ◽

2020 ◽

pp. 537-545

Download Full-text