2017 IEEE International Test Conference (ITC)
Latest Publications

TOTAL DOCUMENTS

67
(FIVE YEARS 0)

H-INDEX

6
(FIVE YEARS 0)

Published By IEEE

9781538634134
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Increasing IJTAG bandwidth and managing security through parallel locking-SIBs

2017 ◽  
Author(s):  
Saurabh Gupta ◽  
Al Crouch ◽  
Jennifer Dworak ◽  
Daniel Engels

Full-scan LBIST with capture-per-cycle hybrid test points

2017 ◽  
Author(s):  
Sylwester Milewski ◽  
Nilanjan Mukherjee ◽  
Janusz Rajski ◽  
Jedrzej Solecki ◽  
Jerzy Tyszer ◽  
...  
Keyword(s):  
Full Scan ◽  
Hybrid Test ◽  
Test Points

Accurate ADC testing with significantly relaxed instrumentation including large cumulative jitter

2017 ◽  
Author(s):  
Li Xu ◽  
Yuming Zhuang ◽  
Rajavelu Thinakaran ◽  
Kenneth M. Butler ◽  
Degang Chen
Keyword(s):  
Adc Testing

DFM-aware fault model and ATPG for intra-cell and inter-cell defects

2017 ◽  
Author(s):  
Arani Sinha ◽  
Sujay Pandey ◽  
Ayush Singhal ◽  
Alodeep Sanyal ◽  
Alan Schmaltz
Keyword(s):  
Fault Model
Load More ...
Sign in / Sign up

Export Citation Format

Share Document