2016 21th IEEE European Test Symposium (ETS)
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61
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9781467396592
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

CPE: Codeword Prediction Encoder

2016 ◽  
Author(s):  
Satish Grandhi ◽  
Elsa Dupraz ◽  
Christian Spagnol ◽  
Valentin Savin ◽  
Emanuel Popovici

Cell Aware and stuck-open tests

2016 ◽  
Author(s):  
Adit D. Singh

scholarly journals IEEE Std P1838: DfT standard-under-development for 2.5D-, 3D-, and 5.5D-SICs

2016 ◽  
Author(s):  
Erik Jan Marinissen ◽  
Teresa McLaurin ◽  
Hailong Jiao

A low-cost susceptibility analysis methodology to selectively harden logic circuits

2016 ◽  
Author(s):  
I. Wali ◽  
B. Deveautour ◽  
A. Virazel ◽  
A. Bosio ◽  
P. Girard ◽  
...  
Keyword(s):  
Low Cost ◽  
Logic Circuits ◽  
Susceptibility Analysis ◽  
Analysis Methodology

A 40Gbps economic extension board and FPGA-based testing platform

2016 ◽  
Author(s):  
Te-Hui Chen ◽  
David C. Keezer
Keyword(s):  
Testing Platform

VecTHOR: Low-cost compression architecture for IEEE 1149-compliant TAP controllers

2016 ◽  
Author(s):  
Sebastian Huhn ◽  
Stephan Eggersgluss ◽  
Rolf Drechsler
Keyword(s):  
Low Cost
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