Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004.
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Towards a BIST technique for noise figure evaluation

Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004. ◽

10.1109/etsym.2004.1347624 ◽

2004 ◽

Cited By ~ 1

Author(s):

M. Negreiros ◽

L. Carro ◽

A.A. Susin

Keyword(s):

Noise Figure

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A new self-checking multiplier by use of a code-disjoint sum-bit duplicated adder

Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004. ◽

10.1109/etsym.2004.1347594 ◽

2004 ◽

Cited By ~ 6

Author(s):

D. Marienfeld ◽

E.S. Sogomonyan ◽

V. Ocheretnij ◽

M. Gossel

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Dynamic read destructive fault in embedded-SRAMs: analysis and march test solution

Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004. ◽

10.1109/etsym.2004.1347645 ◽

2004 ◽

Cited By ~ 38

Author(s):

L. Dilillo ◽

P. Girard ◽

S. Pravossoudovitch ◽

A. Virazel ◽

S. Borri ◽

...

Keyword(s):

Test Solution ◽

March Test

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Delay chain based programmable jitter generator

Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004. ◽

10.1109/etsym.2004.1347578 ◽

2004 ◽

Author(s):

Tian Xia ◽

Peilin Song ◽

K.A. Jenkins ◽

Jien-Chung Lo

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Electrically-induced thermal stimuli forMEMS testing

Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004. ◽

10.1109/etsym.2004.1347605 ◽

2004 ◽

Author(s):

N. Dumas ◽

F. Azais ◽

L. Latorre ◽

P. Nouet

Keyword(s):

Thermal Stimuli

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Relating entropy theory to test data compression

Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004. ◽

10.1109/etsym.2004.1347615 ◽

2004 ◽

Cited By ~ 25

Author(s):

K.J. Balakrishnan ◽

N.A. Touba

Keyword(s):

Data Compression ◽

Test Data ◽

Entropy Theory ◽

Test Data Compression

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A new BIST scheme for 5GHz low noise amplifiers

Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004. ◽

10.1109/etsym.2004.1347625 ◽

2004 ◽

Author(s):

Jee-Youl Ryu ◽

B.C. Kim ◽

I. Sylla

Keyword(s):

Low Noise ◽

Low Noise Amplifiers

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A compression-driven test access mechanism design approach

Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004. ◽

10.1109/etsym.2004.1347617 ◽

2004 ◽

Cited By ~ 16

Author(s):

P.T. Gonciari ◽

B.M. Al-Hashimi

Keyword(s):

Mechanism Design ◽

Design Approach ◽

Test Access Mechanism

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Pipelined test of SOC cores through test data transformations

Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004. ◽

10.1109/etsym.2004.1347612 ◽

2004 ◽

Author(s):

O. Sinanoglu ◽

A. Orailoglu

Keyword(s):

Test Data ◽

Data Transformations

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Accurate tap-delay measurements using a di .erential oscillation technique

Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004. ◽

10.1109/etsym.2004.1347576 ◽

2004 ◽

Author(s):

O. Petre ◽

H.G. Kerkho

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Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004.Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Towards a BIST technique for noise figure evaluation

A new self-checking multiplier by use of a code-disjoint sum-bit duplicated adder

Dynamic read destructive fault in embedded-SRAMs: analysis and march test solution

Delay chain based programmable jitter generator

Electrically-induced thermal stimuli forMEMS testing

Relating entropy theory to test data compression

A new BIST scheme for 5GHz low noise amplifiers

A compression-driven test access mechanism design approach

Pipelined test of SOC cores through test data transformations

Accurate tap-delay measurements using a di .erential oscillation technique

Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004.
Latest Publications