Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)
Latest Publications

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Internationalisation of masters education; globalisation at work

Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06) ◽

10.1109/delta.2006.60 ◽

2006 ◽

Author(s):

T. Mouthaan ◽

A. Kohl

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Application of laser range scanner based terrain referenced navigation systems for aircraft guidance

Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06) ◽

10.1109/delta.2006.15 ◽

2006 ◽

Cited By ~ 4

Author(s):

Maarten Uijt de Haag ◽

A. Vadlamani ◽

J.L. Campbell ◽

J. Dickman

Keyword(s):

Navigation Systems ◽

Laser Range ◽

Terrain Referenced Navigation ◽

Laser Range Scanner

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Performance and stability testing of MSMQ in the .NET environment

Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06) ◽

10.1109/delta.2006.72 ◽

2006 ◽

Author(s):

Jae-Kyu Chun ◽

Seok-Hyung Cho

Keyword(s):

Stability Testing

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Development of a LabVIEW-based test facility for standalone PV systems

Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06) ◽

10.1109/delta.2006.36 ◽

2006 ◽

Cited By ~ 5

Author(s):

Alex See Kok Bin ◽

Shen Weixiang ◽

Ong Kok Seng ◽

S. Ramanathan ◽

Low I-Wern

Keyword(s):

Test Facility ◽

Pv Systems

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Efficient search methods for obtaining exact minimum AND-EXOR expressions

Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06) ◽

10.1109/delta.2006.41 ◽

2006 ◽

Cited By ~ 1

Author(s):

T. Hirayama ◽

Y. Nishitani

Keyword(s):

Search Methods ◽

Efficient Search

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Image noise removal in Nakagami fading channels via Bayesian estimator

Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06) ◽

10.1109/delta.2006.54 ◽

2006 ◽

Cited By ~ 1

Author(s):

Xu Huang ◽

A.C. Madoc ◽

D. Sharma

Keyword(s):

Fading Channels ◽

Noise Removal ◽

Image Noise ◽

Bayesian Estimator ◽

Nakagami Fading ◽

Nakagami Fading Channels

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Industry-academia collaboration in undergraduate test engineering unit development

Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06) ◽

10.1109/delta.2006.58 ◽

2006 ◽

Cited By ~ 7

Author(s):

S. Demidenko ◽

V. Lai ◽

Z.A. Kassim

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VertiCal, a universal calibration system for eSys high performance 32-bit PowerPC microcontrollers; test challenges & solution

Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06) ◽

10.1109/delta.2006.95 ◽

2006 ◽

Author(s):

Chuah Joon Huang ◽

J. Knight

Keyword(s):

High Performance ◽

Calibration System ◽

Universal Calibration

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Robust sensor fault reconstruction using right eigenstructure assignment

Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06) ◽

10.1109/delta.2006.77 ◽

2006 ◽

Author(s):

Chee Pin Tan ◽

C. Edwards ◽

Ye Chow Kuang

Keyword(s):

Eigenstructure Assignment ◽

Sensor Fault ◽

Fault Reconstruction

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Minimizing simultaneous switching noise (SSN) using modified odd/even bus invert method

Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06) ◽

10.1109/delta.2006.68 ◽

2006 ◽

Cited By ~ 3

Author(s):

K.S. Sainarayanan ◽

J.V.R. Ravindra ◽

M.B. Srinivas

Keyword(s):

Switching Noise ◽

Simultaneous Switching Noise ◽

Simultaneous Switching

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Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Internationalisation of masters education; globalisation at work

Application of laser range scanner based terrain referenced navigation systems for aircraft guidance

Performance and stability testing of MSMQ in the .NET environment

Development of a LabVIEW-based test facility for standalone PV systems

Efficient search methods for obtaining exact minimum AND-EXOR expressions

Image noise removal in Nakagami fading channels via Bayesian estimator

Industry-academia collaboration in undergraduate test engineering unit development

VertiCal, a universal calibration system for eSys high performance 32-bit PowerPC microcontrollers; test challenges & solution

Robust sensor fault reconstruction using right eigenstructure assignment

Minimizing simultaneous switching noise (SSN) using modified odd/even bus invert method

Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)
Latest Publications