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Physikalisch-Technischer Teil
Latest Publications
TOTAL DOCUMENTS
233
(FIVE YEARS 0)
H-INDEX
3
(FIVE YEARS 0)
Published By Springer Berlin Heidelberg
9783642501968, 9783642501951
Latest Documents
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Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
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The contrast of transmission electron diffraction patterns
Physikalisch-Technischer Teil
◽
10.1007/978-3-642-50195-1_94
◽
1960
◽
pp. 300-302
Author(s):
J. S. Halliday
Keyword(s):
Electron Diffraction
◽
Transmission Electron Diffraction
◽
Transmission Electron
◽
Diffraction Patterns
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The variations in background intensity of electron diffraction patterns
Physikalisch-Technischer Teil
◽
10.1007/978-3-642-50195-1_93
◽
1960
◽
pp. 297-299
Author(s):
J. S. Halliday
Keyword(s):
Electron Diffraction
◽
Background Intensity
◽
Diffraction Patterns
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Die Streumatrix für die Elektronenbeugung an durchstrahlten Kristallplatten und ihre Verwendung für die Berechnung elektronenoptischer Kristallgitterbilder
Physikalisch-Technischer Teil
◽
10.1007/978-3-642-50195-1_92
◽
1960
◽
pp. 295-297
Author(s):
H. Niehrs
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Materialbearbeitung mit Elektronen-Strahlen
Physikalisch-Technischer Teil
◽
10.1007/978-3-642-50195-1_86
◽
1960
◽
pp. 276-278
◽
Cited By ~ 1
Author(s):
K. H. Steigerwald
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Microanalysis with the X-ray scanning microscope
Physikalisch-Technischer Teil
◽
10.1007/978-3-642-50195-1_83
◽
1960
◽
pp. 267-269
◽
Cited By ~ 2
Author(s):
P. Duncumb
Keyword(s):
Scanning Microscope
◽
X Ray
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Elektronen-Interferenz-Mikroskopie
Physikalisch-Technischer Teil
◽
10.1007/978-3-642-50195-1_75
◽
1960
◽
pp. 233-234
Author(s):
R. Buhl
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Ein Elektronen-Emissions-Mikroskop für metallkundliche Anwendungen
Physikalisch-Technischer Teil
◽
10.1007/978-3-642-50195-1_70
◽
1960
◽
pp. 212-215
Author(s):
G. Möllenstedt
◽
H. Düker
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The new electron microscope “Tronscope TRS-50” Part II: Method of alignment and inspection
Physikalisch-Technischer Teil
◽
10.1007/978-3-642-50195-1_60
◽
1960
◽
pp. 177-181
Author(s):
Kazuhiko Akashi
◽
Tatsunosuke Masuda
◽
Hiroshi Tochigi
Keyword(s):
Electron Microscope
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Recent progress in field emission at high current densities
Physikalisch-Technischer Teil
◽
10.1007/978-3-642-50195-1_6
◽
1960
◽
pp. 20-25
Author(s):
J. K. Trolan
◽
W. P. Dyke
Keyword(s):
Field Emission
◽
Recent Progress
◽
High Current
◽
Current Densities
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A new high voltage (350 kV) universal electron microscope and its applications
Physikalisch-Technischer Teil
◽
10.1007/978-3-642-50195-1_54
◽
1960
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pp. 165-166
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Cited By ~ 1
Author(s):
K. Kobayashi
◽
E. Suito
◽
S. Shimadzu
Keyword(s):
Electron Microscope
◽
High Voltage
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