2012 IEEE 21st Asian Test Symposium
Latest Publications

TOTAL DOCUMENTS

89

(FIVE YEARS 0)

H-INDEX

10

(FIVE YEARS 0)

Published By IEEE

9781467345552, 9780769548760

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Diagnosis of Cell Internal Defects with Multi-cycle Test Patterns

2012 IEEE 21st Asian Test Symposium ◽

10.1109/ats.2012.62 ◽

2012 ◽

Cited By ~ 8

Author(s):

Xiaoxin Fan ◽

Manish Sharma ◽

Wu-Tung Cheng ◽

Sudhakar M. Reddy

Keyword(s):

Internal Defects

Programmable Leakage Test and Binning for TSVs

2012 IEEE 21st Asian Test Symposium ◽

10.1109/ats.2012.13 ◽

2012 ◽

Cited By ~ 1

Author(s):

Yu-Hsiang Lin ◽

Shi-Yu Huang ◽

Kun-Han Tsai ◽

Wu-Tung Cheng

Keyword(s):

Leakage Test

Multi-level EDT to Reduce Scan Channels in SoC Designs

2012 IEEE 21st Asian Test Symposium ◽

10.1109/ats.2012.70 ◽

2012 ◽

Cited By ~ 6

Author(s):

Guoliang Li ◽

Jun Qian ◽

Peter Li ◽

Greg Zuo

Keyword(s):

Multi Level

On Utilizing Test Cube Properties to Reduce Test Data Volume Further

2012 IEEE 21st Asian Test Symposium ◽

10.1109/ats.2012.41 ◽

2012 ◽

Cited By ~ 21

Author(s):

Xijiang Lin ◽

Jansuz Rajski

Keyword(s):

Test Data ◽

Data Volume

A New Procedure for Measuring High-Accuracy Probability Density Functions

2012 IEEE 21st Asian Test Symposium ◽

10.1109/ats.2012.25 ◽

2012 ◽

Cited By ~ 4

Author(s):

Takahiro J. Yamaguchi ◽

Kunihiro Asada ◽

Kiichi Niitsu ◽

Mohamed Abbas ◽

Satoshi Komatsu ◽

...

Keyword(s):

Probability Density ◽

High Accuracy ◽

Probability Density Functions ◽

Density Functions

Foreword

2012 IEEE 21st Asian Test Symposium ◽

10.1109/ats.2012.4 ◽

2012 ◽

Automated Post-Silicon Debugging of Failing Speedpaths

2012 IEEE 21st Asian Test Symposium ◽

10.1109/ats.2012.42 ◽

2012 ◽

Cited By ~ 4

Author(s):

Mehdi Dehbashi ◽

Gorschwin Fey

Keyword(s):

Silicon Debugging

Two-Tone Signal Generation for Communication Application ADC Testing

2012 IEEE 21st Asian Test Symposium ◽

10.1109/ats.2012.12 ◽

2012 ◽

Cited By ~ 10

Author(s):

Keisuke Kato ◽

Fumitaka Abe ◽

Kazuyuki Wakabayashi ◽

Chuan Gao ◽

Takafumi Yamada ◽

...

Keyword(s):

Signal Generation ◽

Tone Signal ◽

Adc Testing

Dual Edge Triggered Flip-Flops for Noise Blocking and Application to Signal Delay Detection

2012 IEEE 21st Asian Test Symposium ◽

10.1109/ats.2012.31 ◽

2012 ◽

Cited By ~ 1

Author(s):

Yoshihiro Ohkawa ◽

Yukiya Miura

Keyword(s):

Signal Delay ◽

Delay Detection

Soft Error Issues with Scaling Technologies

2012 IEEE 21st Asian Test Symposium ◽

10.1109/ats.2012.72 ◽

2012 ◽

Cited By ~ 1

Author(s):

Sanghyeon Baeg ◽

Jongsun Bae ◽

Soonyoung Lee ◽

Chul Seung Lim ◽

Sang Hoon Jeon ◽

...

Keyword(s):

Soft Error