2010 76th ARFTG Microwave Measurement Conference
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9781424474479
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Traceability to national standards for S-parameter measurements in waveguide at frequencies from 140 GHz to 220 GHz

2010 ◽  
Author(s):  
Nick Ridler ◽  
Roland Clarke ◽  
Martin Salter ◽  
Alan Wilson
Keyword(s):  
National Standards ◽  
S Parameter

scholarly journals Broadband measurements of nanofiber devices: Repeatability and random error analysis

2010 ◽  
Author(s):  
T. Mitch Wallis ◽  
Atif Imtiaz ◽  
Sang-Hyun Lim ◽  
Pavel Kabos ◽  
Kichul Kim ◽  
...  
Keyword(s):  
Error Analysis ◽  
Random Error

scholarly journals Noise figure and S-parameter measurement setups for on-wafer differential 60GHz circuits

2010 ◽  
Author(s):  
Pooyan Sakian ◽  
Erwin Janssen ◽  
Jaap Essing ◽  
Reza Mahmoudi ◽  
Arthur van Roermund
Keyword(s):  
Noise Figure ◽  
Parameter Measurement ◽  
S Parameter

Calibration accuracy of a 625 GHz on-wafer probe

2010 ◽  
Author(s):  
Theodore J. Reck ◽  
Lihan Chen ◽  
Chunhu Zhang ◽  
Alex Arsenovic ◽  
Arthur Lichtenberger ◽  
...  
Keyword(s):  
Calibration Accuracy
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