An Internal-Standard Method for Determination of Trace Impurities in Semiconductor Grade Silicon by Neutron Activation Analysis

1981 ◽  
Vol 28 (3) ◽  
pp. 141-147 ◽  
Author(s):  
Chi-Chiang Chou ◽  
Tong-Chuin Pung ◽  
Hui-Tuh Tsai ◽  
Shaw-Chii Wu
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