An Integrated Automatic Test Data Generation System

Case Technology ◽

10.1007/978-1-4615-3644-4_7 ◽

1991 ◽

pp. 129-147 ◽

Cited By ~ 1

Author(s):

A. Jefferson Offutt

Keyword(s):

Test Data ◽

Test Data Generation ◽

Data Generation ◽

Generation System ◽

Automatic Test ◽

Automatic Test Data Generation

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An integrated automatic test data generation system

Journal of Systems Integration ◽

10.1007/bf02262722 ◽

1991 ◽

Vol 1 (3-4) ◽

pp. 391-409 ◽

Cited By ~ 19

Author(s):

A. Jefferson Offutt

Keyword(s):

Test Data ◽

Test Data Generation ◽

Data Generation ◽

Generation System ◽

Automatic Test ◽

Automatic Test Data Generation

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An Automatic Test Data Generation System Based on the Integrated Classification-Tree Methodology

Software Engineering Research and Applications - Lecture Notes in Computer Science ◽

10.1007/978-3-540-24675-6_18 ◽

2004 ◽

pp. 225-238 ◽

Cited By ~ 3

Author(s):

Andrew Cain ◽

Tsong Yueh Chen ◽

Doug Grant ◽

Pak-Lok Poon ◽

Sau-Fun Tang ◽

...

Keyword(s):

Test Data ◽

Classification Tree ◽

Test Data Generation ◽

Data Generation ◽

Generation System ◽

Automatic Test ◽

Automatic Test Data Generation

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Constraint-based automatic test data generation

IEEE Transactions on Software Engineering ◽

10.1109/32.92910 ◽

1991 ◽

Vol 17 (9) ◽

pp. 900-910 ◽

Cited By ~ 452

Author(s):

R.A. DeMilli ◽

A.J. Offutt

Keyword(s):

Test Data ◽

Test Data Generation ◽

Data Generation ◽

Automatic Test ◽

Automatic Test Data Generation

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Automatic Test Data Generation from Embedded C Code

Lecture Notes in Computer Science - Computer Safety, Reliability, and Security ◽

10.1007/978-3-540-30138-7_16 ◽

2004 ◽

pp. 180-194 ◽

Cited By ~ 1

Author(s):

Eileen Dillon ◽

Christophe Meudec

Keyword(s):

Test Data ◽

Test Data Generation ◽

Data Generation ◽

Automatic Test ◽

Automatic Test Data Generation

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An Automatic Test Data Generation Method for Microservice Application

2020 International Conference on Computer Engineering and Application (ICCEA) ◽

10.1109/iccea50009.2020.00048 ◽

2020 ◽

Author(s):

Huixia Ding ◽

Lei Cheng ◽

Qinyuan Li

Keyword(s):

Test Data ◽

Test Data Generation ◽

Data Generation ◽

Automatic Test ◽

Automatic Test Data Generation

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Automatic test data generation using genetic algorithm and program dependence graphs

Information and Software Technology ◽

10.1016/j.infsof.2005.06.006 ◽

2006 ◽

Vol 48 (7) ◽

pp. 586-605 ◽

Cited By ~ 48

Author(s):

James Miller ◽

Marek Reformat ◽

Howard Zhang

Keyword(s):

Genetic Algorithm ◽

Test Data ◽

Test Data Generation ◽

Data Generation ◽

Automatic Test ◽

Dependence Graphs ◽

Automatic Test Data Generation ◽

Program Dependence

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The Use of Automatic Test Data Generation for Genetic Improvement in a Live System

2017 IEEE/ACM 10th International Workshop on Search-Based Software Testing (SBST) ◽

10.1109/sbst.2017.10 ◽

2017 ◽

Cited By ~ 2

Author(s):

Saemundur O. Haraldsson ◽

John R. Woodward ◽

Alexander I.E. Brownlee

Keyword(s):

Test Data ◽

Genetic Improvement ◽

Test Data Generation ◽

Data Generation ◽

Automatic Test ◽

Automatic Test Data Generation

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Automatic Test Data Generation Tool Based on Genetic Simulated Annealing Algorithm

2007 International Conference on Computational Intelligence and Security Workshops (CISW 2007) ◽

10.1109/cisw.2007.4425475 ◽

2007 ◽

Cited By ~ 2

Author(s):

Li Bin ◽

Li Zhi-Shu ◽

Chen Yan-Hong ◽

Li Bao-Lin

Keyword(s):

Simulated Annealing ◽

Test Data ◽

Simulated Annealing Algorithm ◽

Test Data Generation ◽

Data Generation ◽

Automatic Test ◽

Genetic Simulated Annealing Algorithm ◽

Annealing Algorithm ◽

Automatic Test Data Generation

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An Automatic Test Data Generation Tool using Machine Learning

Proceedings of the 13th International Conference on Software Technologies ◽

10.5220/0006836604720481 ◽

2018 ◽

Cited By ~ 2

Author(s):

Ciprian Paduraru ◽

Marius-Constantin Melemciuc

Keyword(s):

Machine Learning ◽

Test Data ◽

Test Data Generation ◽

Data Generation ◽

Automatic Test ◽

Automatic Test Data Generation

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Automatic test data generation for path testing using GAs

Information Sciences ◽

10.1016/s0020-0255(00)00093-1 ◽

2001 ◽

Vol 131 (1-4) ◽

pp. 47-64 ◽

Cited By ~ 62

Author(s):

Jin-Cherng Lin ◽

Pu-Lin Yeh

Keyword(s):

Test Data ◽

Test Data Generation ◽

Data Generation ◽

Automatic Test ◽

Path Testing ◽

Automatic Test Data Generation

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