Determination of boron in borosilicate glasses by neutron capture prompt gamma-ray activation analysis

1987 ◽  
Vol 109 (1) ◽  
pp. 109-115 ◽  
Author(s):  
J. E. Riley ◽  
R. M. Lindstrom
1993 ◽  
Vol 324 ◽  
Author(s):  
Rick L. Paul ◽  
Richard M. Lindstrom

AbstractA reliable nondestructive method for measuring trace amounts of hydrogen in semiconductors and related materials has long been needed. Cold neutron capture prompt γ-ray activation analysis (CNPGAA) is a nondestructive, multielement technique which has found application in the measurement of trace amounts of hydrogen. The sample is irradiated by a beam of “cold” neutrons; the presence of hydrogen is confirmed by the detection of a 2223 keV gamma-ray. The technique gives bulk analyses (the neutron and gamma radiation penetrate the sample), the hydrogen peak is free of interferences, and the results are independent of the chemical form of hydrogen present. The instrument is capable of detecting less than 10 mg/kg of hydrogen in many matrices. We have used the technique to measure hydrogen levels in a dielectric film on a silicon wafer, semiconductor grade germanium, and quartz.


1991 ◽  
Vol 63 (3) ◽  
pp. 288-292 ◽  
Author(s):  
Elizabeth A. Mackey ◽  
Glen E. Gordon ◽  
Richard M. Lindstrom ◽  
David L. Anderson

1998 ◽  
Vol 513 ◽  
Author(s):  
R. L. Paul ◽  
R. M. Lindstrom

ABSTRACTCold neutron prompt gamma-ray activation analysis has proven useful for nondestructive measurement of trace hydrogen. The sample is irradiated in a beam of neutrons; the presence of hydrogen is confirmed by the emission of a 2223 keV gamma-ray. Detection limits for hydrogen are 3 mg/kg in quartz and 8 mg/kg in titanium. We have used the technique to measure hydrogen in titanium alloys, germanium, quartz, fullerenes and their derivatives, and other materials.


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