An Efficient VLSI Test Data Compression Scheme for Circular Scan Architecture Based on Modified Ant Colony Meta-heuristic

2020 ◽  
Vol 36 (3) ◽  
pp. 327-342 ◽  
Author(s):  
Sanjoy Mitra ◽  
Debaprasad Das
2009 ◽  
Vol 31 (10) ◽  
pp. 1826-1834 ◽  
Author(s):  
Wen-Fa ZHAN ◽  
Hua-Guo LIANG ◽  
Feng SHI ◽  
Zheng-Feng HUANG

Author(s):  
Shih-Ping Lin ◽  
Chung-Len Lee ◽  
Jwu-E Chen ◽  
Ji-Jan Chen ◽  
Kun-Lun Luo ◽  
...  

2014 ◽  
Vol 2014 ◽  
pp. 1-7 ◽  
Author(s):  
Hai-feng Wu ◽  
Yu-sheng Cheng ◽  
Wen-fa Zhan ◽  
Yi-fei Cheng ◽  
Qiong Wu ◽  
...  

Test question has already become an important factor to restrict the development of integrated circuit industry. A new test data compression scheme, namely irrational numbers stored (INS), is presented. To achieve the goal of compress test data efficiently, test data is converted into floating-point numbers, stored in the form of irrational numbers. The algorithm of converting floating-point number to irrational number precisely is given. Experimental results for some ISCAS 89 benchmarks show that the compression effect of proposed scheme is better than the coding methods such as FDR, AARLC, INDC, FAVLC, and VRL.


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