A Test Data Compression Scheme Based on Mixed Fixed and Variable Length Coding

2009 ◽  
Vol 31 (10) ◽  
pp. 1826-1834 ◽  
Author(s):  
Wen-Fa ZHAN ◽  
Hua-Guo LIANG ◽  
Feng SHI ◽  
Zheng-Feng HUANG
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Variable Length ◽  
Test Data Compression ◽  
Compression Scheme ◽  
Variable Length Coding

A Multilayer Data Copy Test Data Compression Scheme for Reducing Shifting-in Power for Multiple Scan Design

2007 ◽  
Vol 15 (7) ◽  
pp. 767-776 ◽  
Author(s):  
Shih-Ping Lin ◽  
Chung-Len Lee ◽  
Jwu-E Chen ◽  
Ji-Jan Chen ◽  
Kun-Lun Luo ◽  
...  
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
Scan Design ◽  
Compression Scheme ◽  
Multiple Scan

scholarly journals A Test Data Compression Scheme Based on Irrational Numbers Stored Coding

2014 ◽  
Vol 2014 ◽  
pp. 1-7 ◽  
Author(s):  
Hai-feng Wu ◽  
Yu-sheng Cheng ◽  
Wen-fa Zhan ◽  
Yi-fei Cheng ◽  
Qiong Wu ◽  
...  
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Integrated Circuit ◽  
Irrational Number ◽  
Floating Point ◽  
Test Data Compression ◽  
Compression Scheme ◽  
Test Question ◽  
Irrational Numbers ◽  
Floating Point Number

Test question has already become an important factor to restrict the development of integrated circuit industry. A new test data compression scheme, namely irrational numbers stored (INS), is presented. To achieve the goal of compress test data efficiently, test data is converted into floating-point numbers, stored in the form of irrational numbers. The algorithm of converting floating-point number to irrational number precisely is given. Experimental results for some ISCAS 89 benchmarks show that the compression effect of proposed scheme is better than the coding methods such as FDR, AARLC, INDC, FAVLC, and VRL.

scholarly journals System-on-Chip Test Data Compression Based on Split-Data Variable Length (SDV) Code

2016 ◽  
Vol 07 (08) ◽  
pp. 1213-1223
Author(s):  
J. Robert Theivadas ◽  
V. Ranganathan ◽  
J. Raja Paul Perinbam
Keyword(s):  
Data Compression ◽  
Test Data ◽  
System On Chip ◽  
Variable Length ◽  
Test Data Compression ◽  
On Chip
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