Journal of Electronic Testing
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Published By Springer-Verlag

1573-0727, 0923-8174

Author(s):  
Zsombor Petho ◽  
Intiyaz Khan ◽  
Árpád Torok

AbstractThis article investigates cybersecurity issues related to in-vehicle communication networks. In-vehicle communication network security is evaluated based on the protection characteristics of the network components and the topology of the network. The automotive communication network topologies are represented as undirected weighted graphs, and their vulnerability is estimated based on the specific characteristics of the generated graph. Thirteen different vehicle models have been investigated to compare the vulnerability levels of the in-vehicle network using the Dijkstra's shortest route algorithm. An important advantage of the proposed method is that it is in accordance with the most relevant security evaluation models. On the other hand, the newly introduced approach considers the Secure-by-Design concept principles.


Author(s):  
Somayeh Sadeghi-Kohan ◽  
Sybille Hellebrand ◽  
Hans-Joachim Wunderlich

AbstractSafety-critical systems have to follow extremely high dependability requirements as specified in the standards for automotive, air, and space applications. The required high fault coverage at runtime is usually obtained by a combination of concurrent error detection or correction and periodic tests within rather short time intervals. The concurrent scheme ensures the integrity of computed results while the periodic test has to identify potential aging problems and to prevent any fault accumulation which may invalidate the concurrent error detection mechanism. Such periodic built-in self-test (BIST) schemes are already commercialized for memories and for random logic. The paper at hand extends this approach to interconnect structures. A BIST scheme is presented which targets interconnect defects before they will actually affect the system functionality at nominal speed. A BIST schedule is developed which significantly reduces aging caused by electromigration during the lifetime application of the periodic test.


Author(s):  
Sisir Kumar Jena ◽  
Santosh Biswas ◽  
Jatindra Kumar Deka
Keyword(s):  

Author(s):  
Jaynarayan T. Tudu ◽  
Satyadev Ahlawat ◽  
Sonali Shukla ◽  
Virendra Singh

Author(s):  
Vishwani D. Agrawal

Author(s):  
Muralidharan Jayabalan ◽  
E. Srinivas ◽  
Francis H. Shajin ◽  
P. Rajesh
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