scholarly journals Erratum to: Complementary photothermal techniques for complete thermal characterization of porous and semi-transparent solids

2014 ◽  
Vol 119 (2) ◽  
pp. 1471-1471
Author(s):  
D. Dadarlat ◽  
M. Streza ◽  
O. Onija ◽  
C. Prejmerean ◽  
L. Silaghi-Dumitrescu ◽  
...  
2014 ◽  
Vol 36 (5-6) ◽  
pp. 1349-1357 ◽  
Author(s):  
G. Leahu ◽  
R. Li Voti ◽  
M. C. Larciprete ◽  
C. Sibilia ◽  
M. Bertolotti ◽  
...  

2012 ◽  
Vol 34 (5) ◽  
pp. 948-954 ◽  
Author(s):  
E. Maldonado Alvarado ◽  
E. Ramón-Gallegos ◽  
J. L. Jiménez Pérez ◽  
A. Cruz-Orea ◽  
J. Hernández Rosas

1986 ◽  
Vol 64 (9) ◽  
pp. 1217-1220 ◽  
Author(s):  
P. Cielo ◽  
S. Dallaire ◽  
G. Lamonde ◽  
S. Johar

The measurement of thermal parameters is a useful tool for the evaluation of compositional or structural properties of materials of industrial interest. The increasing use of noncontact photothermal techniques to generate and sense thermal fields in materials makes thermal characterization an attractive approach for in-plant quality monitoring and process control. In an effort to increase the reliability of such measurements in conditions of unknown surface emissivity, an integrating-cavity technique is described for a quantitative evaluation of the thermal inertia of the inspected material. An analysis of the performance of such a technique as a function of the cavity geometry and internal reflectivity is presented. Examples of applications to the characterization of manufactured ceramic materials with different porosity contents are described.


2016 ◽  
Vol 122 (5) ◽  
Author(s):  
José L. Jiménez-Pérez ◽  
Pavel Vieyra Pincel ◽  
Alfredo Cruz-Orea ◽  
Zormy N. Correa-Pacheco

2018 ◽  
Vol 39 (10) ◽  
Author(s):  
J. A. Balderas-López ◽  
M. R. Jaime-Fonseca ◽  
G. Gálvez Coyt ◽  
A. Muñoz-Diosdado ◽  
J. A. Pescador ◽  
...  

2014 ◽  
Vol 119 (1) ◽  
pp. 301-308 ◽  
Author(s):  
D. Dadarlat ◽  
M. Streza ◽  
O. Onija ◽  
C. Prejmerean ◽  
L. Silaghi-Dumitrescu ◽  
...  

2009 ◽  
Vol 74 ◽  
pp. 101-104
Author(s):  
George C.K. Chen ◽  
Srivathsan Vasudevan ◽  
Teu Choon Kiat

Photothermal technology can be applied for thermal characterization of thin films and studying biological live cells. Using pulsed photothermal reflectance technique, thermal conductivity of thin films ranging from 20 nm to a few microns can be determined. Photothermal imaging (PTI) technique can provide ultra high spatial resolution and no fluorescence molecules are required. Comparison with normal phase contrast images, PT images reveal temperature distribution and more information on the intracellular components. Photothermal response (PTR) technique can provide high temporal resolutions. In monitoring the dying process of MDCK cells, significant changes in the PTR signals can be observed whereas unnoticeable changes are found in the images.


1999 ◽  
Vol 6 (1) ◽  
pp. 101-108 ◽  
Author(s):  
E. Delacre ◽  
D. Defer ◽  
E. Antczak ◽  
B. Duthoit

Sign in / Sign up

Export Citation Format

Share Document