Radiation damage in InP single crystals irradiated between 200 and 320°C in a high voltage electron microscope (2 MV)

1982 ◽  
Vol 16 (5) ◽  
pp. 567-570 ◽  
Author(s):  
F. Reynaud ◽  
A. Lasserre ◽  
W.A. Bonner ◽  
S. Mahajan
Keyword(s):  
Electron Microscope ◽  
Radiation Damage ◽  
Single Crystals ◽  
High Voltage ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
High Voltage Electron

Design of Sensitive Photographic Materials for the High-Voltage Electron Microscope

1975 ◽  
Vol 33 ◽  
pp. 156-157
Author(s):  
Murray Vernon King ◽  
Donald F. Parsons
Keyword(s):  
Electron Microscope ◽  
Radiation Damage ◽  
High Voltage ◽  
Radiation Sensitivity ◽  
Fast Electrons ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
High Voltage Electron ◽  
Biological Studies ◽  
Low Sensitivity

Effective application of the high-voltage electron microscope to a wide variety of biological studies has been restricted by the radiation sensitivity of biological systems. The problem of radiation damage has been recognized as a serious factor influencing the amount of information attainable from biological specimens in electron microscopy at conventional voltages around 100 kV. The problem proves to be even more severe at higher voltages around 1 MV. In this range, the problem is the relatively low sensitivity of the existing recording media, which entails inordinately long exposures that give rise to severe radiation damage. This low sensitivity arises from the small linear energy transfer for fast electrons. Few developable grains are created in the emulsion per electron, while most of the energy of the electrons is wasted in the film base.

Ratings of New Films for the High-Voltage Electron Microscope and the Radiation Damage Incurred in Taking Typical Biological Electron Micrographs

1976 ◽  
Vol 34 ◽  
pp. 580-581
Author(s):  
Murray Vernon King ◽  
Donald F. Parsons
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Image Quality ◽  
Radiation Damage ◽  
High Voltage ◽  
Radiation Doses ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
High Voltage Electron ◽  
Typical Specimen

Radiation damage to biological specimens being examined in the electron microscope inevitably restricts the amount of information that can be gathered. This problem is especially severe in the high-voltage electron microscope (HVEM), where the relatively low sensitivities of existing photographic materials entail inordinately long exposures to specimens to the beam that cause enhanced radiation damage, in spite of early hopes that this instrument would alleviate the radiation-damage problem.We have reported studies of the sensitivities and resolutions of commercial and experimental photographic materials for use with 1-MeV electrons. In the present study, we have chosen certain photographic materials as representing typical films used for electron microscopy or as possessing a favorable combination of sensitivity and resolution for biological electron microscopy, and we have followed the course of impairment of image quality as a selected area of a typical specimen is subjected to ever larger radiation doses.

Sign in / Sign up

Export Citation Format

Share Document