Study of the semiconductor crystal surface; Structure rearrangement using heavy ion scattering technique

1972 ◽  
Vol 33 (2) ◽  
pp. 221-227 ◽  
Author(s):  
V.A. Molchanov ◽  
V.A. Snisar
1979 ◽  
Vol 85 (2-3) ◽  
pp. 201-205 ◽  
Author(s):  
R.E. Neese ◽  
M.W. Guidry ◽  
R. Donangelo ◽  
J.O. Rasmussen

1990 ◽  
Vol 237 (1) ◽  
pp. 19-23 ◽  
Author(s):  
B.T. Kim ◽  
M. Naito ◽  
T. Udagawa

1985 ◽  
Vol 441 (2) ◽  
pp. 381-396 ◽  
Author(s):  
R. Wolf ◽  
O. Tanimura ◽  
R. Kaps ◽  
U. Mosel

1977 ◽  
Vol 291 (1) ◽  
pp. 183-205 ◽  
Author(s):  
W.G. Love ◽  
T. Terasawa ◽  
G.R. Satchler

1976 ◽  
Vol 269 (1) ◽  
pp. 223-236 ◽  
Author(s):  
Norman K. Glendenning ◽  
Georg Wolschin

1978 ◽  
Vol 76 (5) ◽  
pp. 556-558 ◽  
Author(s):  
P. Doll ◽  
M. Bini ◽  
D.L. Hendrie ◽  
S.K. Kauffmann ◽  
J. Mahoney ◽  
...  

1996 ◽  
Vol 599 (1-2) ◽  
pp. 283-288 ◽  
Author(s):  
A. Ringbom ◽  
G. Tibell ◽  
R. Zorro ◽  
J. Blomgren ◽  
H. Condé ◽  
...  

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