Study of the semiconductor crystal surface; Structure rearrangement using heavy ion scattering technique
1979 ◽
Vol 85
(2-3)
◽
pp. 201-205
◽
Keyword(s):
1987 ◽
Vol 328
(1)
◽
pp. 67-79
◽
1977 ◽
Vol 291
(1)
◽
pp. 183-205
◽
Keyword(s):
1996 ◽
Vol 599
(1-2)
◽
pp. 283-288
◽