A method for the determination of the thermal transport properties of submicron-thick dielectric films with the use of an analytical expression
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1971 ◽
Vol 55
(1)
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pp. 132-140
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1974 ◽
Vol 60
(11)
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pp. 4475-4482
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2012 ◽
Vol 37
(6)
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pp. 5128-5136
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1972 ◽
Vol 56
(8)
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pp. 3789-3793
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1989 ◽
Vol 48
(3)
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pp. 261-267
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Keyword(s):
2005 ◽
Vol 125
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pp. 395-398
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