Atom-probe and field emission electron spectroscopy studies of ordered structures and electronic properties of Ge overlayers on Ir-tips

1994 ◽  
Vol 76-77 ◽  
pp. 291-296 ◽  
Author(s):  
Makoto Ashino ◽  
Masahiko Tomitori ◽  
Osamu Nishikawa
Keyword(s):  
Electronic Properties ◽  
Field Emission ◽  
Electron Spectroscopy ◽  
Atom Probe ◽  
Ordered Structures ◽  
Emission Electron ◽  
Spectroscopy Studies

THE ATOM-PROBE WITH A FIELD EMISSION ELECTRON SPECTROMETER

1989 ◽  
Vol 50 (C8) ◽  
pp. C8-507-C8-512
Author(s):  
O. NISHIKAWA ◽  
H. KOYAMA ◽  
N. KODAMA ◽  
M. TOMITORI
Keyword(s):  
Field Emission ◽  
Atom Probe ◽  
Electron Spectrometer ◽  
Emission Electron

Atom-probe and field emission electron spectroscope studies of Ge on Ir

1993 ◽  
Vol 67 (1-4) ◽  
pp. 43-47 ◽  
Author(s):  
Makoto Ashino ◽  
Masahiko Tomitori ◽  
Osamu Nishikawa
Keyword(s):  
Field Emission ◽  
Atom Probe ◽  
Emission Electron

Nanotube electronic states observed with thermal field emission electron spectroscopy

1999 ◽  
Vol 75 (18) ◽  
pp. 2773-2775 ◽  
Author(s):  
Kenneth A. Dean ◽  
Oliver Groening ◽  
Olivier M. Küttel ◽  
L. Schlapbach
Keyword(s):  
Field Emission ◽  
Electron Spectroscopy ◽  
Thermal Field ◽  
Electronic States ◽  
Emission Electron

Field-emission electron spectroscopy of single-atom tips

1992 ◽  
Vol 69 (17) ◽  
pp. 2527-2530 ◽  
Author(s):  
Vu Thien Binh ◽  
S. T. Purcell ◽  
N. Garcia ◽  
J. Doglioni
Keyword(s):  
Field Emission ◽  
Electron Spectroscopy ◽  
Single Atom ◽  
Emission Electron

Observation of Phase Contrast Images in STEM and CTEM Modes by Using 100 kV Field Emission Electron Gun

1974 ◽  
Vol 32 ◽  
pp. 390-391
Author(s):  
Y. Harada ◽  
T. Goto ◽  
H. Koike ◽  
T. Someya
Keyword(s):  
Field Emission ◽  
Phase Contrast ◽  
Image Formation ◽  
Fresnel Diffraction ◽  
Experimental Results ◽  
Electron Gun ◽  
Scanning Microscopy ◽  
Emission Electron ◽  
Lattice Images

Since phase contrasts of STEM images, that is, Fresnel diffraction fringes or lattice images, manifest themselves in field emission scanning microscopy, the mechanism for image formation in the STEM mode has been investigated and compared with that in CTEM mode, resulting in the theory of reciprocity. It reveals that contrast in STEM images exhibits the same properties as contrast in CTEM images. However, it appears that the validity of the reciprocity theory, especially on the details of phase contrast, has not yet been fully proven by the experiments. In this work, we shall investigate the phase contrast images obtained in both the STEM and CTEM modes of a field emission microscope (100kV), and evaluate the validity of the reciprocity theory by comparing the experimental results.

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