Analysis and calibration of in situ scanning tunnelling microscopy images with atomic resolution influenced by surface drift phenomena

1994 ◽  
Vol 67 (3) ◽  
pp. 213-220 ◽  
Author(s):  
Jens E.T. Andersen ◽  
P. Møller
2003 ◽  
Vol 12 (9) ◽  
pp. 1011-1015 ◽  
Author(s):  
Zhou Xiao-Lin ◽  
Chen Xiang-Rong ◽  
Yang Xiang-Dong ◽  
Gou Qing-Quan

1999 ◽  
Vol 432 (1-2) ◽  
pp. 8-20 ◽  
Author(s):  
M. Bode ◽  
M. Hennefarth ◽  
D. Haude ◽  
M. Getzlaff ◽  
R. Wiesendanger

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