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Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Intracavity power addition with a close-ended composite four-mirror cavity

2007 ◽  
Vol 16 (12) ◽  
pp. 3710-3718
Author(s):  
Lei Ming ◽  
Gong Ma-Li ◽  
Liu Qiang ◽  
Zhang Hai-Tao ◽  
Wang Yun-Xiang

Image encryption using high-dimension chaotic system

2007 ◽  
Vol 16 (12) ◽  
pp. 3616-3623 ◽  
Author(s):  
Sun Fu-Yan ◽  
Liu Shu-Tang ◽  
Lü Zong-Wang
Keyword(s):  
Image Encryption ◽  
Chaotic System ◽  
High Dimension

The double Lagrangian with U (1, J ) symmetry and its applications to the cosmology

2007 ◽  
Vol 16 (12) ◽  
pp. 3560-3565
Author(s):  
Wu Ya-Bo ◽  
Lü Jian-Bo ◽  
He Jing ◽  
Fu Ming-Hui

Growth parameter dependence of magnetic property of CrAs thin film

2007 ◽  
Vol 16 (12) ◽  
pp. 3868-3872 ◽  
Author(s):  
Bi Jing-Feng ◽  
Zhao Jian-Hua ◽  
Deng Jia-Jun ◽  
Zheng Yu-Hong ◽  
Wang Wei-Zhu ◽  
...  
Keyword(s):  
Thin Film ◽  
Magnetic Property ◽  
Growth Parameter ◽  
Parameter Dependence

scholarly journals The effects of degree correlations on network topologies and robustness

2007 ◽  
Vol 16 (12) ◽  
pp. 3571-3580 ◽  
Author(s):  
Zhao Jing ◽  
Tao Lin ◽  
Yu Hong ◽  
Luo Jian-Hua ◽  
Cao Zhi-Wei ◽  
...  
Keyword(s):  
Network Topologies ◽  
Degree Correlations

scholarly journals HL-2A tokamak disruption forecasting based on an artificial neural network

2007 ◽  
Vol 16 (12) ◽  
pp. 3738-3741 ◽  
Author(s):  
Wang Hao ◽  
Wang Ai-Ke ◽  
Yang Qing-Wei ◽  
Ding Xuan-Tong ◽  
Dong Jia-Qi ◽  
...  
Keyword(s):  
Neural Network ◽  
Artificial Neural Network ◽  
Artificial Neural

Effect of interface-roughness scattering on mobility degradation in SiGe p-MOSFETs with a high- k dielectric/SiO 2 gate stack

2007 ◽  
Vol 16 (12) ◽  
pp. 3820-3826 ◽  
Author(s):  
Zhang Xue-Feng ◽  
Xu Jing-Ping ◽  
Lai Pui-To ◽  
Li Chun-Xia ◽  
Guan Jian-Guo
Keyword(s):  
Interface Roughness ◽  
Gate Stack ◽  
Mobility Degradation ◽  
High K ◽  
Interface Roughness Scattering ◽  
High K Dielectric
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