Towards artifact-free characterization of surface topography using complex wavelets and total variation minimization
2005 ◽
Vol 170
(2)
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pp. 1014-1030
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2013 ◽
Vol 22
(2)
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pp. 021012
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2015 ◽
Vol 449
(4)
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pp. 3537-3542
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2021 ◽
Vol 9
(3)
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pp. 035042
2017 ◽
Vol 12
(3)
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pp. 1007-1014
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2019 ◽
Vol 28
(4)
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pp. 1851-1865
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2015 ◽
Vol 3
(4)
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pp. 045001
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Keyword(s):
2013 ◽
Vol 278-280
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pp. 414-417
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Keyword(s):