scholarly journals A Switch from High-Fidelity to Error-Prone DNA Double-Strand Break Repair Underlies Stress-Induced Mutation

2005 ◽  
Vol 19 (6) ◽  
pp. 791-804 ◽  
Author(s):  
Rebecca G. Ponder ◽  
Natalie C. Fonville ◽  
Susan M. Rosenberg
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