Nonparametric Bayesian reliability analysis of masked data with dependent competing risks

2021 ◽  
Vol 210 ◽  
pp. 107502
Author(s):  
Bin Liu ◽  
Yimin Shi ◽  
Hon Keung Tony Ng ◽  
Xiangwen Shang
2001 ◽  
Vol 73 (2) ◽  
pp. 169-173 ◽  
Author(s):  
Michael Rosholm ◽  
Michael Svarer

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