Study on Reliability Design of the Domestic Compressor Subjected to Repetitive Internal Stresses by Parametric Accelerated Life Testing

This chapter explains the parametric accelerated life testing (ALT) to recognize design defects in mechanical products. A life-stress model and a sample size formulation are suggested. A compressor is used to demonstrate this method. Compressors were failing in the field. At the first ALT, the compressor failed due to a fractured suction reed valve. The failure modes were similar to those valves returned from the field. The fatigue of the suction reed valves came from an overlap between the suction reed valve and the valve plate. The problematic design was modified by the trespan dimensions, tumbling process, a ball peening, and brushing process for the valve plate. At the second ALT, the compressor locked due to the intrusion between the crankshaft and thrust washer. The corrective action plan performed the heat treatment to the exterior of the crankshaft made of cast iron. After the design modifications, there were no troubles during the third ALT. The lifetime of compressor was secured to have a B1 life 10 years.

Lifetime estimation of tantalum capacitor for mobile applications using empirical and experimental techniques: a DOE approach

PurposeCapacitors are one of the most common passive components on a circuit board. From a tiny toy to substantial satellite, a capacitor plays an important role. Untimely failure of a capacitor can destruct the entire system. This research paper targets the reliability assessment of tantalum capacitor, to reduce e-waste and enhance its reusable capability.Design/methodology/approachThe residual lifetime of a tantalum capacitor is estimated using the empirical method, i.e. military handbook MILHDBK2017F, and validated using an experimental approach, i.e. accelerated life testing (ALT). The various influencing acceleration factors are explored, and experiments are designed using Taguchi's approach. Empirical methods such as the military handbook is used for assessing the reliability of a tantalum capacitor, for ground and mobile applications.FindingsAfter exploring the lifetime of a tantalum capacitor using empirical and experimental techniques, an error analysis is conducted, which shows the validity of empirical technique, with an accuracy of 95.21%.Originality/valueThe condition monitoring and health prognostics of tantalum capacitors, for ground and mobile applications, are explored using empirical and experimental techniques, which warns the user about its residual lifetime so that the faulty component can be replaced in time.