Investigation of the particulate matter contained in the water sample, revealed the presence of a number of different types and certain of these were selected for analysis.An A.E.I. Corinth electron microscope was modified to accept a Kevex Si (Li) detector. To allow for existing instruments to be readily modified, this was kept to a minimum. An additional port is machined in the specimen region to accept the detector, with the liquid nitrogen cooling dewar conveniently housed in the left hand cupboard adjacent to the microscope column. Since background radiation leads to loss in the sensitivity of the instrument, great care has been taken to reduce this effect by screening and manufacturing components that are near the specimen from material of low atomic number. To change from normal transmission imaging to X-ray analysis, the special 4-position specimen rod is inserted through the normal specimen airlock.
A sensitive electrochemical analysis for cadmium and lead based on Nafion-Bismuth film in a water sample
