Comparison of minority carrier diffusion length measurements in silicon solar cells by the photo-induced open-circuit voltage decay (OCVD) with different excitation sources
1994 ◽
Vol 41
(3)
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pp. 367-372
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2001 ◽
Vol 69
(3)
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pp. 297-302
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1994 ◽
Vol 33
(3)
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pp. 317-329
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