scholarly journals Fast Acquisition of Tilt-series for High-resolution Sub-tomogram Averaging

2020 ◽  
Vol 26 (S2) ◽  
pp. 3000-3000
Author(s):  
Alberto Bartesaghi ◽  
Hsuan-Fu Liu ◽  
Jonathan Bouvette ◽  
Joshua Strauss ◽  
Mario Borgnia
2021 ◽  
Vol 27 (S1) ◽  
pp. 3240-3240
Author(s):  
Sagar Khavnekar ◽  
William Wan ◽  
Philipp Erdmann ◽  
Jürgen Plitzko

2000 ◽  
Vol 6 (S2) ◽  
pp. 1148-1149
Author(s):  
U. Ziese ◽  
A.H. Janssen ◽  
T.P. van der Krift ◽  
A.G. van Balen ◽  
W.J. de Ruijter ◽  
...  

Electron tomography is a three-dimensional (3D) imaging method with transmission electron microscopy (TEM) that provides high-resolution 3D images of structural arrangements. Conventional TEM images are in first approximation mere 2D-projections of a 3D sample under investigation. With electron tomographya series of images is acquired of a sample that is tilted over a large angular range (±70°) with small angular tilt increments (so called tilt-series). For the subsequent 3D-reconstruction, the images of the tilt series are aligned relative to each other and the 3D-reconstruction is computed. Electron tomography is the only technique that can provide true 3D information with nm-scale resolution of individual and unique samples. For (cell) biology and material science applications the availability of high-resolution 3D images of structural arrangements within individual samples provides unique architectural information that cannot be obtained otherwise. Routine application of electron tomography will comprise a major revolutionary step forward in the characterization of complex materials and cellular arrangements.


2020 ◽  
Vol 38 (16) ◽  
pp. 4572-4579
Author(s):  
Felipe Calliari ◽  
Marlon M. Correia ◽  
Guilherme Penello Temporao ◽  
Gustavo C. Amaral ◽  
Jean Pierre von der Weid

2013 ◽  
Vol 19 (S2) ◽  
pp. 542-543
Author(s):  
R. Hovden ◽  
P. Ercius ◽  
Y. Jiang ◽  
D. Wang ◽  
Y. Yu ◽  
...  

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.


2009 ◽  
Vol 61 (4) ◽  
pp. 775-784 ◽  
Author(s):  
Xi Chen ◽  
Meijin Lin ◽  
Zhong Chen ◽  
Jianhui Zhong

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