scholarly journals Evaluation method of image resolution for the aberration-corrected STEM

2021 ◽  
Vol 27 (S1) ◽  
pp. 1594-1595
Author(s):  
Yasuhiko Sugigaki ◽  
Yoshifumi Taniguchi ◽  
Yudai Kubo ◽  
Kuniyasu Nakamura ◽  
Susumu Koyama ◽  
...  
2011 ◽  
Vol 17 (S2) ◽  
pp. 1286-1287
Author(s):  
W Sinkler ◽  
S Bradley ◽  
L Allard ◽  
P Voyles

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.


2007 ◽  
Vol 13 (S02) ◽  
Author(s):  
K van Benthem ◽  
S-H Oh ◽  
M Oxley ◽  
S Rashkeev ◽  
A Marinopoulos ◽  
...  

2009 ◽  
Vol 110 (1) ◽  
pp. 36-42 ◽  
Author(s):  
Koji Kuramochi ◽  
Takashi Yamazaki ◽  
Yasutoshi Kotaka ◽  
Masahiro Ohtsuka ◽  
Iwao Hashimoto ◽  
...  

2007 ◽  
Vol 13 (S02) ◽  
Author(s):  
SH Oh ◽  
K van Benthem ◽  
SI Molina ◽  
P Werner ◽  
D Kumar ◽  
...  

2017 ◽  
Vol 176 ◽  
pp. 146-150 ◽  
Author(s):  
Jian Liu ◽  
Nan Jian ◽  
Isabel Ornelas ◽  
Alexander J. Pattison ◽  
Tanja Lahtinen ◽  
...  

2014 ◽  
Vol 522 ◽  
pp. 012039
Author(s):  
M J McLaren ◽  
F S Hage ◽  
M Loving ◽  
Q M Ramasse ◽  
L H Lewis ◽  
...  

2011 ◽  
Vol 17 (S2) ◽  
pp. 1678-1679
Author(s):  
D Kepaptsoglou ◽  
I Jensen ◽  
M Sarahan ◽  
Q Ramasse ◽  
H Schreuders ◽  
...  

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.


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