Rapid Determination of Fluoride in Silica-Alumina Catalyst by Steam Hydrolysis

1960 ◽  
Vol 32 (2) ◽  
pp. 189-192 ◽  
Author(s):  
L. W. Gamble ◽  
W. E. Price ◽  
W. H. Jones
1973 ◽  
Vol 2 (2) ◽  
pp. 107-110 ◽  
Author(s):  
Haruo Yoshizumi ◽  
Yoshifusa Shimada ◽  
Takayasu Shirasaki

1983 ◽  
Vol 259 ◽  
pp. 69-77 ◽  
Author(s):  
Yoshio Uemichi ◽  
Akimi Ayame ◽  
Yasunori Kashiwaya ◽  
Hisao Kanoh

Author(s):  
T. Y. Tan ◽  
W. K. Tice

In studying ion implanted semiconductors and fast neutron irradiated metals, the need for characterizing small dislocation loops having diameters of a few hundred angstrom units usually arises. The weak beam imaging method is a powerful technique for analyzing these loops. Because of the large reduction in stacking fault (SF) fringe spacing at large sg, this method allows for a rapid determination of whether the loop is faulted, and, hence, whether it is a perfect or a Frank partial loop. This method was first used by Bicknell to image small faulted loops in boron implanted silicon. He explained the fringe spacing by kinematical theory, i.e., ≃l/(Sg) in the fault fringe in depth oscillation. The fault image contrast formation mechanism is, however, really more complicated.


2017 ◽  
Vol 45 (2) ◽  
pp. 455-464
Author(s):  
T.T. Xue ◽  
J. Liu ◽  
Y.B. Shen ◽  
G.Q. Liu

2013 ◽  
Vol 40 (11) ◽  
pp. 1725-1729
Author(s):  
Lang ZHOU ◽  
Qiao-Jing LI ◽  
Yong-Sheng LI ◽  
Xiu-Feng GAO

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