In-depth profile analysis of oxide films by radiofrequency glow discharge optical emission spectrometry (rf-GD-OES): possibilities of depth-resolved solid-state speciation

2008 ◽  
Vol 23 (10) ◽  
pp. 1378 ◽  
Author(s):  
Julien Malherbe ◽  
Beatriz Fernández ◽  
Hervé Martinez ◽  
Patrick Chapon ◽  
Peter Panjan ◽  
...  

2011 ◽  
Vol 684 (1-2) ◽  
pp. 47-53 ◽  
Author(s):  
Pascal Sánchez ◽  
Beatriz Fernández ◽  
Armando Menéndez ◽  
Jaime Orejas ◽  
Rosario Pereiro ◽  
...  






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