Edge dislocation trapping by a cylindrical inclusion near a traction‐free surface

1981 ◽  
Vol 52 (2) ◽  
pp. 1104-1107 ◽  
Author(s):  
L. Stagni ◽  
R. Lizzio
Keyword(s):  
Free Surface ◽  
Edge Dislocation ◽  
Cylindrical Inclusion

scholarly journals Elastodynamic image forces on dislocations

2015 ◽  
Vol 471 (2181) ◽  
pp. 20150433 ◽  
Author(s):  
Beñat Gurrutxaga-Lerma ◽  
Daniel S. Balint ◽  
Daniele Dini ◽  
Adrian P. Sutton
Keyword(s):  
Free Surface ◽  
Rayleigh Wave ◽  
Edge Dislocation ◽  
Wave Speed ◽  
Image Force ◽  
Inertial Effects ◽  
Screw Dislocations ◽  
The Core ◽  
Slow Moving ◽  
Rayleigh Wave Speed

The elastodynamic image forces on edge and screw dislocations in the presence of a planar-free surface are derived. The explicit form of the elastodynamic fields of an injected, quiescent screw dislocation are also derived. The resulting image forces are affected by retardation effects: the dislocations experience no image force for a period of time defined by the arrival and reflection at the free surface of the dislocation fields. For the case of injected, stationary dislocations, it is shown that the elastodynamic image force tends asymptotically to the elastotatic prediction. For the case of injected, moving dislocations, it is shown that the elastodynamic image force on both the edge and the screw dislocations is magnified by inertial effects, and becomes increasingly divergent with time; this additional effect, missing in the elastostatic description, is shown to be substantial even for slow moving dislocations. Finally, it is shown that the elastodynamic image force of an edge dislocation moving towards the surface at the Rayleigh wave speed becomes repulsive, rather than attractive; this is suggestive of instabilities at the core of the dislocation, and likely resonances with the free surface.

Atomistic calculation of the interaction between an edge dislocation and a free surface

1998 ◽  
Vol 78 (5) ◽  
pp. 377-383 ◽  
Author(s):  
A. Aslanides ◽  
V. Pontikis
Keyword(s):  
Free Surface ◽  
Edge Dislocation ◽  
Atomistic Calculation

scholarly journals Effect of interface stresses on the image force and stability of an edge dislocation inside a nanoscale cylindrical inclusion

2009 ◽  
Vol 46 (6) ◽  
pp. 1413-1422 ◽  
Author(s):  
Q.H. Fang ◽  
Y.W. Liu ◽  
B. Jin ◽  
P.H. Wen
Keyword(s):  
Edge Dislocation ◽  
Image Force ◽  
Cylindrical Inclusion

On the role of tin underlays for the prevention of thermal grooving in thin gold films

1986 ◽  
Vol 44 ◽  
pp. 732-733
Author(s):  
Jin Young Kim ◽  
R. E. Hummel ◽  
R. T. DeHoff
Keyword(s):  
Thin Film ◽  
Free Surface ◽  
Grain Boundary ◽  
Beneficial Effect ◽  
Failure Mechanism ◽  
Failure Mechanisms ◽  
Distinct Advantage ◽  
Gold Films ◽  
Gold Thin Film

Gold thin film metallizations in microelectronic circuits have a distinct advantage over those consisting of aluminum because they are less susceptible to electromigration. When electromigration is no longer the principal failure mechanism, other failure mechanisms caused by d.c. stressing might become important. In gold thin-film metallizations, grain boundary grooving is the principal failure mechanism.Previous studies have shown that grain boundary grooving in gold films can be prevented by an indium underlay between the substrate and gold. The beneficial effect of the In/Au composite film is mainly due to roughening of the surface of the gold films, redistribution of indium on the gold films and formation of In2O3 on the free surface and along the grain boundaries of the gold films during air annealing.

Interaction between parallel edge dislocation lines in a smectic a liquid crystal

1974 ◽  
Vol 35 (4) ◽  
pp. 49-51 ◽  
Author(s):  
M. Kléman ◽  
C.E. Williams
Keyword(s):  
Liquid Crystal ◽  
Edge Dislocation ◽  
Parallel Edge ◽  
Smectic A
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